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Appl Opt. 1999 May 1;38(13):2843-7.

Measurement of absolute displacement by a double-modulation technique based on a Michelson interferometer.

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1
Institute of Optical Sciences, National Central University, Chung-Li, Taiwan.

Abstract

A novel method is presented for of measuring absolute displacement with a synthesized wavelength interferometer. The optical phase of the interferometer is simultaneously modulated with a frequency-modulated laser diode and optical path-length difference. The error signal originating from the intensity modulation of the source is eliminated by a signal processing circuit. In addition, a lock-in technique is used to demodulate the envelope of the interferometric signal. The displacement signal is derived by the self-mixing technique.

PMID:
18319864
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