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Rev Sci Instrum. 2007 Jul;78(7):073706.

Application of a charge-coupled device photon-counting technique to three-dimensional element analysis of a plant seed (alfalfa) using a full-field x-ray fluorescence imaging microscope.

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Graduate School of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennoudai, Tsukuba, Ibaraki 305-8571, Japan.


A full-field x-ray fluorescence imaging microscope using a Wolter mirror was constructed at Photon Factory BL3C2. White x rays from a bending magnet were used to excite x-ray fluorescence and to enhance the x-ray fluorescence intensity. A photon-counting method using a charge-coupled device was applied to obtain an x-ray fluorescence spectrum at the image plane. The spatial distributions of some specific atoms such as Fe and Zn were obtained from photon-counting calculations. An energy resolution of 220 eV at the Fe Kalpha line was obtained from the x-ray fluorescence spectrum by the photon-counting method. The newly developed three-dimensional element mappings of the specific atoms were accomplished by the photon-counting method and a reconstruction technique using computed tomography.

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