A flat-field extreme ultraviolet (EUV) spectrometer with a varied line spacing groove grating (1200 grooves/mm at grating center) has been developed to study the emission spectra from highly ionized medium Z impurities in large helical device (LHD). It covers a wavelength range of 50-500 A using a mechanically ruled grating, which was later replaced by a newly developed laminar-type holographic grating for comparative studies. Differences in spectral resolution, intensities of higher order spectra, and sensitivities of the spectrometer were studied between the two gratings by observing the emission spectra of LHD plasmas. Although the achieved resolution was alike between them, i.e., deltalambda approximately 0.24 A at 200 A, the holographic grating was much superior in suppressing the higher order light than the ruled grating. The relative sensitivity between the two gratings was evaluated using continuum radiation from LHD plasmas. As a result, it was found that the holographic grating has a flat response in the full wavelength range, but the sensitivity of the ruled grating drops sharply below 200 A. A new technique for the absolute calibration of the EUV holographic grating spectrometer was tried by combining the continuum radiation with a branching ratio of C IV lines (3p-3s: 5800 A/3p-2s: 312 A), and an accurate absolute sensitivity has been successfully obtained.