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J Synchrotron Radiat. 2006 Jul;13(Pt 4):293-303. Epub 2006 Jun 15.

On the use of CCD area detectors for high-resolution specular X-ray reflectivity.

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1
Chemistry Division, Argonne National Laboratory, Argonne, IL 60439, USA. fenter@anl.gov

Abstract

The use and application of charge coupled device (CCD) area detectors for high-resolution specular X-ray reflectivity is discussed. Direct comparison of high-resolution specular X-ray reflectivity data measured with CCD area detectors and traditional X-ray scintillator ('point') detectors demonstrates that the use of CCD detectors leads to a substantial (approximately 30-fold) reduction in data acquisition rates because of the elimination of the need to scan the sample to distinguish signal from background. The angular resolution with a CCD detector is also improved by a factor of approximately 3. The ability to probe the large dynamic range inherent to high-resolution X-ray reflectivity data in the specular reflection geometry was demonstrated with measurements of the orthoclase (001)- and alpha-Al2O3 (012)-water interfaces, with measured reflectivity signals varying by a factor of approximately 10(6) without the use of any beam attenuators. Statistical errors in the reflectivity signal are also derived and directly compared with the repeatability of the measurements.

PMID:
16799220
DOI:
10.1107/S0909049506018000
[Indexed for MEDLINE]
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