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J Electron Microsc (Tokyo). 2005 Aug;54(4):379-83. Epub 2005 Aug 2.

Micro-CT of Pseudocneorhinus bifasciatus by projection X-ray microscopy.

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Meiji University, Department of Physics, 1-1-1 Higashimita, Tama-ku, Kawasaki 214-8571, Japan.


The projection X-ray microscope utilises a very small X-ray source emitted from a thin (0.1-3 microm) target metal film excited by the focused electron beam of a scanning electron microscope. When an object is placed just below the target metal film, the diverging X-rays enlarge the shadow of the object. Because no X-ray optics such as a zone-plate is used, the focal depth is, in principle, infinitely large. We exploited this to apply projection X-ray microscopy to three-dimensional (3-D) structure analysis by means of cone-beam computed tomography. The projection images of a small arthropod (Pseudocneorhinus bifasciatus, 5 mm in length), was recorded at 3 degrees increments over the whole range (360 degrees) of a stepping-motor-controlled sample rotator. A 3-D image was reconstructed from corn-beam projections using a filtered back-projection algorithm. The reconstructed 3-D image showed in detail the internal structure of an opaque object.

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