Send to

Choose Destination
Phys Rev Lett. 2004 Sep 24;93(13):136101. Epub 2004 Sep 20.

Atomic-resolution dynamic force microscopy and spectroscopy of a single-walled carbon nanotube: characterization of interatomic van der Waals forces.

Author information

Institute of Applied Physics, University of Hamburg, Jungiusstrasse 11, D-20355 Hamburg, Germany.


We report atomic-resolution imaging and site-specific quantitative force measurements on a single-walled carbon nanotube by dynamic force microscopy and three-dimensional force field spectroscopy at low temperatures. The topography imaged in the attractive force regime reflects the trigonal arrangement of the hollow sites as maxima. Individual force curves were unambiguously assigned to carbon atoms and hollow sites, respectively. Site-specific quantitative evaluation revealed that the short-range interatomic van der Waals forces are responsible for the atomic-scale contrast.

Supplemental Content

Full text links

Icon for American Physical Society
Loading ...
Support Center