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J Microsc. 2002 Oct;208(Pt 1):24-34.

SMART--a program to measure SEM resolution and imaging performance.

Author information

1
EM Facility, University of Tennessee, Knoxville, TN 37996-0840, USA. djoy@utk.edu

Abstract

It is important to be able to measure the parameters, such as spatial resolution, astigmastism, signal-to-noise ratio, and drift and instability, that characterize the performance of a scanning electron microscope. These quantities can be determined most reliably by a Fourier analysis of digital micrographs from the instrument, recorded under conditions of interest. A program designed to implement all of the necessary steps in an automated manner has been developed as a 'macro' for the popular, and freely available, NIH Image and SCION Image programs.

PMID:
12366595
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