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Figure 2

Figure 2. From: Memory properties and charge effect study in Si nanocrystals by scanning capacitance microscopy and spectroscopy.

Si nanocrystal images. (a) Topography (b) SCM data image.

Zhen Lin, et al. Nanoscale Res Lett. 2011;6(1):163-163.
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Figure 4

Figure 4. From: Memory properties and charge effect study in Si nanocrystals by scanning capacitance microscopy and spectroscopy.

SCM image (a) and signal (b) versus different AC bias.

Zhen Lin, et al. Nanoscale Res Lett. 2011;6(1):163-163.
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Figure 5

Figure 5. From: Memory properties and charge effect study in Si nanocrystals by scanning capacitance microscopy and spectroscopy.

Charge and discharge with different DC bias.

Zhen Lin, et al. Nanoscale Res Lett. 2011;6(1):163-163.
6.
Figure 3

Figure 3. From: Memory properties and charge effect study in Si nanocrystals by scanning capacitance microscopy and spectroscopy.

SCM image (a) and signal (b) versus different DC bias.

Zhen Lin, et al. Nanoscale Res Lett. 2011;6(1):163-163.
7.
Figure 7

Figure 7. From: Memory properties and charge effect study in Si nanocrystals by scanning capacitance microscopy and spectroscopy.

SCS curve shift after charge injection by +10 and -10 V.

Zhen Lin, et al. Nanoscale Res Lett. 2011;6(1):163-163.

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