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Items: 7

1.
In-Hwan Song, James E. Dennis
J Electron Microsc (Tokyo) 2010 Dec; 59(6): 527–530. Published online 2010 Aug 23. doi: 10.1093/jmicro/dfq064
PMCID:
PMC3156677
2.
Natsuko Nakamura, Yuko Shimizu, Takao Shinkawa, Munetaka Nakata, Benjamin Bammes, Junjie Zhang, Wah Chiu
J Electron Microsc (Tokyo) 2010 Aug; 59(4): 299–310. Published online 2010 Mar 30. doi: 10.1093/jmicro/dfq009
PMCID:
PMC3388909
3.
Zongli Li, Richard K. Hite, Yifan Cheng, Thomas Walz
J Electron Microsc (Tokyo) 2010 Feb; 59(1): 53–63. Published online 2009 Jul 30. doi: 10.1093/jmicro/dfp036
PMCID:
PMC3156676
4.
John E. Heuser
J Electron Microsc (Tokyo) 2011 Aug; 60(Suppl 1): S3–S29. doi: 10.1093/jmicro/dfr044
PMCID:
PMC3202940
5.
Jason Pierson, Matthijn Vos, J. Richard McIntosh, Peter J. Peters
J Electron Microsc (Tokyo) 2011 Aug; 60(Suppl 1): S93–S100. doi: 10.1093/jmicro/dfr014
PMCID:
PMC3156678
6.
Tailun Zhao, Paul S. Weinhold, Nicole Y. Lee, Laurence E. Dahners
J Electron Microsc (Tokyo) 2011 Apr; 60(2): 177–182. Published online 2011 Feb 22. doi: 10.1093/jmicro/dfr005
PMCID:
PMC3156675
7.
James P. Buban, Quentin Ramasse, Bryant Gipson, Nigel D. Browning, Henning Stahlberg
J Electron Microsc (Tokyo) 2010 Apr; 59(2): 103–112. Published online 2009 Nov 14. doi: 10.1093/jmicro/dfp052
PMCID:
PMC2857930

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