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Journal of electron microscopy

Author(s):
Denshi Kenbikyō Gakkai (Japan)
Nihon Denshi Kenbikyo Gakkai
NLM Title Abbreviation:
J Electron Microsc (Tokyo)
ISO Abbreviation:
J Electron Microsc (Tokyo)
Title(s):
Journal of electron microscopy.
Absorbed:
Denshi kenbikyō (Tokyo, Japan : 1950) ISSN 0417-0326
Other Title(s):
Denshi Kenbikyo Gakkai shi; kikan
Journal of electronmicroscopy
J ELECTRON MICROSC (TOKYO)
Continued By:
Microscopy (Oxford, England) ISSN 2050-5698
Continued In Part by:
Denshi kenbikyō (Tokyo, Japan : 1974)
Publication Start Year:
1953
Publication End Year:
2012
Frequency:
Bimonthly, <1992>-2012
Country of Publication:
Japan
Publisher:
Tokyo : Japanese Society of Electron Microscopy : Oxford University Press
Description:
v. ill.
Language:
English
Other Languages:
English(Summary)
ISSN:
0022-0744 (Print)
1477-9986 (Electronic)
0022-0744 (Linking)
Coden:
JELJA7
Electronic Links:
https://academic.oup.com/jmicro
Selectively In:
Index medicus v13n3, 1964-v61n6, Dec. 2012
MEDLINE v13n3, 1964-v61n6, Dec. 2012
PubMed v13n3, 1964-v61n6, Dec. 2012
Current Indexing Status:
Not currently indexed for MEDLINE.
Version Indexed:
Electronic
MeSH:
Microscopy, Electron*
Broad Subject Term(s):
Diagnostic Imaging
Publication Type(s):
Periodical
Notes:
Added title in Japanese: Denshi Kenbikyo Gakkai shi; kikan.
Also issued online.
Articles in English or Japanese, 1960-73; in English with summaries in English, 1974-
Issued 1953-63 by the Society of Electron-Microscopy; 1964- by the Japanese Society of Electron Microscopy.
Latest issue consulted: Vol. 61, no. 6 (Dec. 2012).
Other ID:
(DNLM)J19760000(s)
(OCoLC)04578751
NLM ID:
7611157 [Serial]

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