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Related Articles by Review for PMID: 21711666
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Atomic characterization of Si nanoclusters embedded in SiO2 by atom probe tomography.
Nanoscale Res Lett. 2011 Feb 23;6(1):164. doi: 10.1186/1556-276X-6-164.
Nanoscale Res Lett. 2011.
PMID: 21711666
Free PMC article.
Atomic-Scale Characterization of Droplet Epitaxy Quantum Dots.
Gajjela RSR, Koenraad PM.
Gajjela RSR, et al.
Nanomaterials (Basel). 2021 Jan 3;11(1):85. doi: 10.3390/nano11010085.
Nanomaterials (Basel). 2021.
PMID: 33401568
Free PMC article.
Review.
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3D electron microscopy in the physical sciences: the development of Z-contrast and EFTEM tomography.
Midgley PA, Weyland M.
Midgley PA, et al.
Ultramicroscopy. 2003 Sep;96(3-4):413-31. doi: 10.1016/S0304-3991(03)00105-0.
Ultramicroscopy. 2003.
PMID: 12871805
Review.
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