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Results: 5

1.

Short-range six-axis interferometer controlled positioning for scanning probe microscopy.

Lazar J, Klapetek P, Valtr M, Hrabina J, Buchta Z, Cip O, Cizek M, Oulehla J, Sery M.

Sensors (Basel). 2014 Jan 7;14(1):877-86. doi: 10.3390/s140100877.

PMID:
24451463
[PubMed]
Free PMC Article
2.

Voice coil-based scanning probe microscopy.

Klapetek P, Valtr M, Duchoň V, Sobota J.

Nanoscale Res Lett. 2012 Jun 21;7(1):332.

PMID:
22720756
[PubMed - as supplied by publisher]
Free PMC Article
3.

Non-equidistant scanning approach for millimetre-sized SPM measurements.

Klapetek P, Valtr M, Buršík P.

Nanoscale Res Lett. 2012 Apr 11;7:213. doi: 10.1186/1556-276X-7-213.

PMID:
22587490
[PubMed]
Free PMC Article
4.

Atomic force microscopy analysis of nanoparticles in non-ideal conditions.

Klapetek P, Valtr M, Nečas D, Salyk O, Dzik P.

Nanoscale Res Lett. 2011 Aug 30;6(1):514. doi: 10.1186/1556-276X-6-514.

PMID:
21878120
[PubMed]
Free PMC Article
5.

Near-field scanning optical microscope probe analysis.

Klapetek P, Bursík J, Valtr M, Martinek J.

Ultramicroscopy. 2008 Jun;108(7):671-6. Epub 2007 Nov 12.

PMID:
18068903
[PubMed]

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