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Results: 6

1.

Large area high-speed metrology SPM system.

Klapetek P, Valtr M, Picco L, Payton OD, Martinek J, Yacoot A, Miles M.

Nanotechnology. 2015 Feb 13;26(6):065501. doi: 10.1088/0957-4484/26/6/065501. Epub 2015 Jan 19.

PMID:
25597347
2.

Short-range six-axis interferometer controlled positioning for scanning probe microscopy.

Lazar J, Klapetek P, Valtr M, Hrabina J, Buchta Z, Cip O, Cizek M, Oulehla J, Sery M.

Sensors (Basel). 2014 Jan 7;14(1):877-86. doi: 10.3390/s140100877.

3.

Voice coil-based scanning probe microscopy.

Klapetek P, Valtr M, Duchoň V, Sobota J.

Nanoscale Res Lett. 2012 Jun 21;7(1):332.

4.

Non-equidistant scanning approach for millimetre-sized SPM measurements.

Klapetek P, Valtr M, Buršík P.

Nanoscale Res Lett. 2012 Apr 11;7:213. doi: 10.1186/1556-276X-7-213.

5.

Atomic force microscopy analysis of nanoparticles in non-ideal conditions.

Klapetek P, Valtr M, Nečas D, Salyk O, Dzik P.

Nanoscale Res Lett. 2011 Aug 30;6(1):514. doi: 10.1186/1556-276X-6-514.

6.

Near-field scanning optical microscope probe analysis.

Klapetek P, Bursík J, Valtr M, Martinek J.

Ultramicroscopy. 2008 Jun;108(7):671-6. Epub 2007 Nov 12.

PMID:
18068903
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