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Results: 1 to 20 of 22

1.

Full-field X-ray microscopy with crossed partial multilayer Laue lenses.

Niese S, Krüger P, Kubec A, Braun S, Patommel J, Schroer CG, Leson A, Zschech E.

Opt Express. 2014 Aug 25;22(17):20008-13. doi: 10.1364/OE.22.020008.

PMID:
25321210
2.

Ptychography with multilayer Laue lenses.

Kubec A, Braun S, Niese S, Krüger P, Patommel J, Hecker M, Leson A, Schroer CG.

J Synchrotron Radiat. 2014 Sep;21(Pt 5):1122-7. doi: 10.1107/S1600577514014556. Epub 2014 Aug 9.

PMID:
25178001
3.

Ronchi test for characterization of X-ray nanofocusing optics and beamlines.

Uhlén F, Rahomäki J, Nilsson D, Seiboth F, Sanz C, Wagner U, Rau C, Schroer CG, Vogt U.

J Synchrotron Radiat. 2014 Sep;21(Pt 5):1105-9. doi: 10.1107/S160057751401323X. Epub 2014 Aug 1.

PMID:
25177999
4.

Hard X-ray nanofocusing at low-emittance synchrotron radiation sources.

Schroer CG, Falkenberg G.

J Synchrotron Radiat. 2014 Sep;21(Pt 5):996-1005. doi: 10.1107/S1600577514016269. Epub 2014 Aug 29.

5.

Damage investigation on tungsten and diamond diffractive optics at a hard x-ray free-electron laser.

Uhlén F, Nilsson D, Holmberg A, Hertz HM, Schroer CG, Seiboth F, Patommel J, Meier V, Hoppe R, Schropp A, Lee HJ, Nagler B, Galtier E, Krzywinski J, Sinn H, Vogt U.

Opt Express. 2013 Apr 8;21(7):8051-61. doi: 10.1364/OE.21.008051.

PMID:
23571895
6.

Full spatial characterization of a nanofocused x-ray free-electron laser beam by ptychographic imaging.

Schropp A, Hoppe R, Meier V, Patommel J, Seiboth F, Lee HJ, Nagler B, Galtier EC, Arnold B, Zastrau U, Hastings JB, Nilsson D, Uhlén F, Vogt U, Hertz HM, Schroer CG.

Sci Rep. 2013;3:1633. doi: 10.1038/srep01633.

7.

Ronchi test for characterization of nanofocusing optics at a hard x-ray free-electron laser.

Nilsson D, Uhlén F, Holmberg A, Hertz HM, Schropp A, Patommel J, Hoppe R, Seiboth F, Meier V, Schroer CG, Galtier E, Nagler B, Lee HJ, Vogt U.

Opt Lett. 2012 Dec 15;37(24):5046-8. doi: 10.1364/OL.37.005046.

PMID:
23258000
8.

Scanning X-ray nanodiffraction: from the experimental approach towards spatially resolved scattering simulations.

Dubslaff M, Hanke M, Patommel J, Hoppe R, Schroer CG, Schöder S, Burghammer M.

Nanoscale Res Lett. 2012 Oct 6;7(1):553. doi: 10.1186/1556-276X-7-553.

9.

Compact x-ray microradiograph for in situ imaging of solidification processes: bringing in situ x-ray micro-imaging from the synchrotron to the laboratory.

Rakete C, Baumbach C, Goldschmidt A, Samberg D, Schroer CG, Breede F, Stenzel C, Zimmermann G, Pickmann C, Houltz Y, Lockowandt C, Svenonius O, Wiklund P, Mathiesen RH.

Rev Sci Instrum. 2011 Oct;82(10):105108. doi: 10.1063/1.3650468.

PMID:
22047330
10.

Full optical characterization of coherent x-ray nanobeams by ptychographic imaging.

Hönig S, Hoppe R, Patommel J, Schropp A, Stephan S, Schöder S, Burghammer M, Schroer CG.

Opt Express. 2011 Aug 15;19(17):16324-9. doi: 10.1364/OE.19.016324.

PMID:
21934996
11.

X-ray imaging: The chemistry inside.

Schroer CG.

Nature. 2011 Aug 10;476(7359):159-60. doi: 10.1038/476159a. No abstract available.

PMID:
21833080
12.

Structure and flow of droplets on solid surfaces.

Müller-Buschbaum P, Magerl D, Hengstler R, Moulin JF, Körstgens V, Diethert A, Perlich J, Roth SV, Burghammer M, Riekel C, Gross M, Varnik F, Uhlmann P, Stamm M, Feldkamp JM, Schroer CG.

J Phys Condens Matter. 2011 May 11;23(18):184111. doi: 10.1088/0953-8984/23/18/184111. Epub 2011 Apr 20.

PMID:
21508480
13.

Non-destructive and quantitative imaging of a nano-structured microchip by ptychographic hard X-ray scanning microscopy.

Schropp A, Boye P, Goldschmidt A, Hönig S, Hoppe R, Patommel J, Rakete C, Samberg D, Stephan S, Schöder S, Burghammer M, Schroer CG.

J Microsc. 2011 Jan;241(1):9-12. doi: 10.1111/j.1365-2818.2010.03453.x.

PMID:
21118244
14.

Hard and soft X-ray microscopy and tomography in catalysis: bridging the different time and length scales.

Grunwaldt JD, Schroer CG.

Chem Soc Rev. 2010 Dec;39(12):4741-53. doi: 10.1039/c0cs00036a. Epub 2010 Oct 26.

PMID:
20978666
15.

Colloidal silver nanoparticle gradient layer prepared by drying between two walls of different wettability.

Roth SV, Kuhlmann M, Walter H, Snigirev A, Snigireva I, Lengeler B, Schroer CG, Burghammer M, Riekel C, Müller-Buschbaum P.

J Phys Condens Matter. 2009 Jul 1;21(26):264012. doi: 10.1088/0953-8984/21/26/264012. Epub 2009 Jun 11.

PMID:
21828460
16.

Grazing incidence small-angle X-ray scattering microtomography demonstrated on a self-ordered dried drop of nanoparticles.

Kuhlmann M, Feldkamp JM, Patommel J, Roth SV, Timmann A, Gehrke R, Müller-Buschbaum P, Schroer CG.

Langmuir. 2009 Jul 7;25(13):7241-3. doi: 10.1021/la901325y.

PMID:
19499917
17.

Coherent x-ray diffraction imaging with nanofocused illumination.

Schroer CG, Boye P, Feldkamp JM, Patommel J, Schropp A, Schwab A, Stephan S, Burghammer M, Schöder S, Riekel C.

Phys Rev Lett. 2008 Aug 29;101(9):090801. Epub 2008 Aug 29.

PMID:
18851597
18.

Compact x-ray microtomography system for element mapping and absorption imaging.

Feldkamp JM, Schroer CG, Patommel J, Lengeler B, Günzler TF, Schweitzer M, Stenzel C, Dieckmann M, Schroeder WH.

Rev Sci Instrum. 2007 Jul;78(7):073702.

PMID:
17672761
19.

2D-mapping of the catalyst structure inside a catalytic microreactor at work: partial oxidation of methane over Rh/Al2O3.

Grunwaldt JD, Hannemann S, Schroer CG, Baiker A.

J Phys Chem B. 2006 May 4;110(17):8674-80.

PMID:
16640423
20.

Focusing hard x rays to nanometer dimensions by adiabatically focusing lenses.

Schroer CG, Lengeler B.

Phys Rev Lett. 2005 Feb 11;94(5):054802. Epub 2005 Feb 10.

PMID:
15783651
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