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Results: 12

1.

Full-field X-ray microscopy with crossed partial multilayer Laue lenses.

Niese S, Krüger P, Kubec A, Braun S, Patommel J, Schroer CG, Leson A, Zschech E.

Opt Express. 2014 Aug 25;22(17):20008-13. doi: 10.1364/OE.22.020008.

PMID:
25321210
2.

Ptychography with multilayer Laue lenses.

Kubec A, Braun S, Niese S, Krüger P, Patommel J, Hecker M, Leson A, Schroer CG.

J Synchrotron Radiat. 2014 Sep;21(Pt 5):1122-7. doi: 10.1107/S1600577514014556. Epub 2014 Aug 9.

PMID:
25178001
3.

Kinoform diffractive lenses for efficient nano-focusing of hard X-rays.

Karvinen P, Grolimund D, Willimann M, Meyer B, Birri M, Borca C, Patommel J, Wellenreuther G, Falkenberg G, Guizar-Sicairos M, Menzel A, David C.

Opt Express. 2014 Jul 14;22(14):16676-85. doi: 10.1364/OE.22.016676.

PMID:
25090486
4.

Damage investigation on tungsten and diamond diffractive optics at a hard x-ray free-electron laser.

Uhlén F, Nilsson D, Holmberg A, Hertz HM, Schroer CG, Seiboth F, Patommel J, Meier V, Hoppe R, Schropp A, Lee HJ, Nagler B, Galtier E, Krzywinski J, Sinn H, Vogt U.

Opt Express. 2013 Apr 8;21(7):8051-61. doi: 10.1364/OE.21.008051.

PMID:
23571895
5.

Full spatial characterization of a nanofocused x-ray free-electron laser beam by ptychographic imaging.

Schropp A, Hoppe R, Meier V, Patommel J, Seiboth F, Lee HJ, Nagler B, Galtier EC, Arnold B, Zastrau U, Hastings JB, Nilsson D, Uhlén F, Vogt U, Hertz HM, Schroer CG.

Sci Rep. 2013;3:1633. doi: 10.1038/srep01633.

6.

Ronchi test for characterization of nanofocusing optics at a hard x-ray free-electron laser.

Nilsson D, Uhlén F, Holmberg A, Hertz HM, Schropp A, Patommel J, Hoppe R, Seiboth F, Meier V, Schroer CG, Galtier E, Nagler B, Lee HJ, Vogt U.

Opt Lett. 2012 Dec 15;37(24):5046-8. doi: 10.1364/OL.37.005046.

PMID:
23258000
7.

Scanning X-ray nanodiffraction: from the experimental approach towards spatially resolved scattering simulations.

Dubslaff M, Hanke M, Patommel J, Hoppe R, Schroer CG, Schöder S, Burghammer M.

Nanoscale Res Lett. 2012 Oct 6;7(1):553. doi: 10.1186/1556-276X-7-553.

8.

Full optical characterization of coherent x-ray nanobeams by ptychographic imaging.

Hönig S, Hoppe R, Patommel J, Schropp A, Stephan S, Schöder S, Burghammer M, Schroer CG.

Opt Express. 2011 Aug 15;19(17):16324-9. doi: 10.1364/OE.19.016324.

PMID:
21934996
9.

Non-destructive and quantitative imaging of a nano-structured microchip by ptychographic hard X-ray scanning microscopy.

Schropp A, Boye P, Goldschmidt A, Hönig S, Hoppe R, Patommel J, Rakete C, Samberg D, Stephan S, Schöder S, Burghammer M, Schroer CG.

J Microsc. 2011 Jan;241(1):9-12. doi: 10.1111/j.1365-2818.2010.03453.x.

PMID:
21118244
10.

Grazing incidence small-angle X-ray scattering microtomography demonstrated on a self-ordered dried drop of nanoparticles.

Kuhlmann M, Feldkamp JM, Patommel J, Roth SV, Timmann A, Gehrke R, Müller-Buschbaum P, Schroer CG.

Langmuir. 2009 Jul 7;25(13):7241-3. doi: 10.1021/la901325y.

PMID:
19499917
11.

Coherent x-ray diffraction imaging with nanofocused illumination.

Schroer CG, Boye P, Feldkamp JM, Patommel J, Schropp A, Schwab A, Stephan S, Burghammer M, Schöder S, Riekel C.

Phys Rev Lett. 2008 Aug 29;101(9):090801. Epub 2008 Aug 29.

PMID:
18851597
12.

Compact x-ray microtomography system for element mapping and absorption imaging.

Feldkamp JM, Schroer CG, Patommel J, Lengeler B, Günzler TF, Schweitzer M, Stenzel C, Dieckmann M, Schroeder WH.

Rev Sci Instrum. 2007 Jul;78(7):073702.

PMID:
17672761
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