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Results: 6

1.

Structural and optical characterization of pure Si-rich nitride thin films.

Debieu O, Nalini RP, Cardin J, Portier X, Perrière J, Gourbilleau F.

Nanoscale Res Lett. 2013 Jan 16;8(1):31. doi: 10.1186/1556-276X-8-31.

PMID:
23324447
[PubMed]
Free PMC Article
2.

SiOx/SiNy multilayers for photovoltaic and photonic applications.

Nalini RP, Khomenkova L, Debieu O, Cardin J, Dufour C, Carrada M, Gourbilleau F.

Nanoscale Res Lett. 2012 Feb 14;7:124. doi: 10.1186/1556-276X-7-124.

PMID:
22333343
[PubMed]
Free PMC Article
3.

Electromagnetic modeling of waveguide amplifier based on Nd3+ Si-rich SiO2 layers by means of the ADE-FDTD method.

Dufour C, Cardin J, Debieu O, Fafin A, Gourbilleau F.

Nanoscale Res Lett. 2011 Apr 4;6(1):278. doi: 10.1186/1556-276X-6-278.

PMID:
21711829
[PubMed]
Free PMC Article
4.

Electrical behavior of MIS devices based on Si nanoclusters embedded in SiOxNy and SiO2 films.

Jacques E, Pichon L, Debieu O, Gourbilleau F.

Nanoscale Res Lett. 2011 Feb 24;6(1):170. doi: 10.1186/1556-276X-6-170.

PMID:
21711698
[PubMed]
Free PMC Article
5.

Effect of the Nd content on the structural and photoluminescence properties of silicon-rich silicon dioxide thin films.

Debieu O, Cardin J, Portier X, Gourbilleau F.

Nanoscale Res Lett. 2011 Feb 21;6(1):161. doi: 10.1186/1556-276X-6-161.

PMID:
21711673
[PubMed]
Free PMC Article
6.

Accurate measurement method of Fabry-Perot cavity parameters via optical transfer function.

Bondu F, Debieu O.

Appl Opt. 2007 May 10;46(14):2611-4.

PMID:
17446908
[PubMed]

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