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Opt Express. 2011 Jul 18;19(15):14137-44. doi: 10.1364/OE.19.014137.

A novel encoded-phase technique for phase measuring profilometry.

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  • 1Opto-Electronic Department, Sichuan University, Chengdu 610064, China.


Three-dimensional (3-D) shape measurement using a novel encoded-phase grating is proposed. The projected sinusoidal fringe patterns are designed with wrapped and encoded phase instead of monotonic and unwrapped phase. Phase values of the projected fringes on the surface are evaluated by phase-shift technique. The absolute phase is then restored with reference to the encoded information, which is extracted from the differential of the wrapped phase. To solve the phase errors at some phase-jump areas, Hilbert transform is employed. By embedding the encoded information in the wrapped phase, there is no extra pattern that needs to be projected. The experimental results identify its feasibility and show the possibility to measure the spatially isolated objects. It will be promising to analyze dynamic objects.

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