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Items: 1 to 20 of 128

1.

Finite-size effects and analytical modeling of electrostatic force microscopy applied to dielectric films.

Gomila G, Gramse G, Fumagalli L.

Nanotechnology. 2014 Jun 27;25(25):255702. doi: 10.1088/0957-4484/25/25/255702. Epub 2014 Jun 4.

PMID:
24897410
2.

Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy.

Castellano-Hernández E, Moreno-Llorena J, Sáenz JJ, Sacha GM.

J Phys Condens Matter. 2012 Apr 18;24(15):155303. doi: 10.1088/0953-8984/24/15/155303. Epub 2012 Mar 23.

PMID:
22442155
3.

The jump-into-contact effect in biased AFM probes on dielectric films and its application to quantify the dielectric permittivity of thin layers.

Revilla RI.

Nanotechnology. 2016 Jul 1;27(26):265705. doi: 10.1088/0957-4484/27/26/265705. Epub 2016 May 20.

PMID:
27199351
4.

Numerical study of the lateral resolution in electrostatic force microscopy for dielectric samples.

Riedel C, Alegría A, Schwartz GA, Colmenero J, Sáenz JJ.

Nanotechnology. 2011 Jul 15;22(28):285705. doi: 10.1088/0957-4484/22/28/285705. Epub 2011 Jun 7.

PMID:
21646694
5.

Quantification of the dielectric constant of single non-spherical nanoparticles from polarization forces: eccentricity effects.

Gomila G, Esteban-Ferrer D, Fumagalli L.

Nanotechnology. 2013 Dec 20;24(50):505713. doi: 10.1088/0957-4484/24/50/505713. Epub 2013 Nov 27.

PMID:
24284953
6.

Quantitative dielectric constant measurement of thin films by DC electrostatic force microscopy.

Gramse G, Casuso I, Toset J, Fumagalli L, Gomila G.

Nanotechnology. 2009 Sep 30;20(39):395702. doi: 10.1088/0957-4484/20/39/395702. Epub 2009 Sep 2.

PMID:
19724109
7.

Dielectric and ellipsometric studies of the dynamics in thin films of isotactic poly(methylmethacrylate) with one free surface.

Sharp JS, Forrest JA.

Phys Rev E Stat Nonlin Soft Matter Phys. 2003 Mar;67(3 Pt 1):031805. Epub 2003 Mar 24.

PMID:
12689094
8.

Interference effects in the sum frequency generation spectra of thin organic films. II: Applications to different thin-film systems.

Tong Y, Zhao Y, Li N, Ma Y, Osawa M, Davies PB, Ye S.

J Chem Phys. 2010 Jul 21;133(3):034705. doi: 10.1063/1.3428673.

PMID:
20649348
9.

Influence of test capacitor features on piezoelectric and dielectric measurement of ferroelectric films.

Wang Z, Lau GK, Zhu W, Chao C.

IEEE Trans Ultrason Ferroelectr Freq Control. 2006 Jan;53(1):15-22.

PMID:
16471427
10.

Interference effects in the sum frequency generation spectra of thin organic films. I. Theoretical modeling and simulation.

Tong Y, Zhao Y, Li N, Osawa M, Davies PB, Ye S.

J Chem Phys. 2010 Jul 21;133(3):034704. doi: 10.1063/1.3428668.

PMID:
20649347
11.

Influence of film thickness on the phase separation mechanism in ultrathin conducting polymer blend films.

Meier R, Ruderer MA, Diethert A, Kaune G, Körstgens V, Roth SV, Müller-Buschbaum P.

J Phys Chem B. 2011 Mar 31;115(12):2899-909. doi: 10.1021/jp200341u. Epub 2011 Mar 3.

PMID:
21370827
12.

The use of artificial neural networks in electrostatic force microscopy.

Castellano-Hernández E, Rodríguez FB, Serrano E, Varona P, Sacha GM.

Nanoscale Res Lett. 2012 May 15;7(1):250. doi: 10.1186/1556-276X-7-250.

13.

Extreme hardening of PDMS thin films due to high compressive strain and confined thickness.

Xu W, Chahine N, Sulchek T.

Langmuir. 2011 Jul 5;27(13):8470-7. doi: 10.1021/la201122e. Epub 2011 Jun 2.

PMID:
21634411
14.

Nanoscale electric polarizability of ultrathin biolayers on insulating substrates by electrostatic force microscopy.

Dols-Perez A, Gramse G, Calò A, Gomila G, Fumagalli L.

Nanoscale. 2015 Nov 21;7(43):18327-36. doi: 10.1039/c5nr04983k.

PMID:
26488226
15.

Contrast inversion in electrostatic force microscopy imaging of trapped charges: tip-sample distance and dielectric constant dependence.

Riedel C, Alegría A, Arinero R, Colmenero J, Sáenz JJ.

Nanotechnology. 2011 Aug 26;22(34):345702. doi: 10.1088/0957-4484/22/34/345702. Epub 2011 Jul 28.

PMID:
21795775
16.

Quantitative scanning near-field microwave microscopy for thin film dielectric constant measurement.

Karbassi A, Ruf D, Bettermann AD, Paulson CA, van der Weide DW, Tanbakuchi H, Stancliff R.

Rev Sci Instrum. 2008 Sep;79(9):094706. doi: 10.1063/1.2953095.

PMID:
19044445
17.
18.
19.

Glass transitions and dynamics in thin polymer films: dielectric relaxation of thin films of polystyrene

Fukao K, Miyamoto Y.

Phys Rev E Stat Phys Plasmas Fluids Relat Interdiscip Topics. 2000 Feb;61(2):1743-54.

PMID:
11046459
20.

Preferentially oriented BaTiO3 thin films deposited on silicon with thin intermediate buffer layers.

George JP, Beeckman J, Woestenborghs W, Smet PF, Bogaerts W, Neyts K.

Nanoscale Res Lett. 2013 Feb 7;8(1):62. doi: 10.1186/1556-276X-8-62.

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