Format
Items per page
Sort by

Send to:

Choose Destination

Results: 1 to 20 of 94

Similar articles for PubMed (Select 24663997)

1.

Vibration-insensitive measurement of thickness variation of glass panels using double-slit interferometry.

Kim JA, Kim JW, Eom TB, Jin J, Kang CS.

Opt Express. 2014 Mar 24;22(6):6486-94. doi: 10.1364/OE.22.006486.

PMID:
24663997
2.

Quadrature laser interferometer for in-line thickness measurement of glass panels using a current modulation technique.

Kim JA, Kang CS, Eom TB, Jin J, Suh HS, Kim JW.

Appl Opt. 2014 Jul 10;53(20):4604-10. doi: 10.1364/AO.53.004604.

PMID:
25090083
4.
5.

Surface and thickness measurement of a transparent film using wavelength scanning interferometry.

Gao F, Muhamedsalih H, Jiang X.

Opt Express. 2012 Sep 10;20(19):21450-6. doi: 10.1364/OE.20.021450.

PMID:
23037266
6.
7.

High-speed measurement of three-dimensional surface profiles up to 10 μm using two-wavelength phase-shifting interferometry utilizing an injection locking technique.

Jang R, Kang CS, Kim JA, Kim JW, Kim JE, Park HY.

Appl Opt. 2011 Apr 10;50(11):1541-7. doi: 10.1364/AO.50.001541.

PMID:
21478926
8.
9.

Differential heterodyne interferometer for measuring thickness of glass panels.

Protopopov V, Cho S, Kim K, Lee S, Kim H.

Rev Sci Instrum. 2007 Jul;78(7):076101.

PMID:
17672800
10.

Reflectometry-based wavelength scanning interferometry for thickness measurements of very thin wafers.

Ghim YS, Suratkar A, Davies A.

Opt Express. 2010 Mar 29;18(7):6522-9. doi: 10.1364/OE.18.006522.

PMID:
20389675
11.

Measurement of absolute optical thickness of mask glass by wavelength-tuning Fourier analysis.

Kim Y, Hbino K, Sugita N, Mitsuishi M.

Opt Lett. 2015 Jul 1;40(13):3169-72. doi: 10.1364/OL.40.003169.

PMID:
26125394
12.

Frequency-scanning interferometry for dynamic absolute distance measurement using Kalman filter.

Tao L, Liu Z, Zhang W, Zhou Y.

Opt Lett. 2014 Dec 15;39(24):6997-7000. doi: 10.1364/OL.39.006997.

PMID:
25503050
13.

Separation algorithm for a 2D refractive index distribution and thickness profile of a phase object by laser diode-based multiwavelength interferometry.

Lee K, Ryu SY, Kwak YK, Kim S, Lee YW.

Rev Sci Instrum. 2009 May;80(5):053114. doi: 10.1063/1.3142482.

PMID:
19485499
14.

Simultaneous measurement method of total and self-interference for the volumetric thickness-profilometer.

You JW, Kim D, Ryu SY, Kim S.

Opt Express. 2009 Feb 2;17(3):1352-60.

PMID:
19188964
15.
16.

Profile measurement of glass sheet using multiple wavelength backpropagation interferometry.

Choi S, Otsuki K, Sasaki O, Suzuki T.

Appl Opt. 2013 Jun 1;52(16):3726-31. doi: 10.1364/AO.52.003726.

PMID:
23736326
17.

Characteristics of a scanning nano-slit image sensor for line-and-space patterns.

George A, Milster TD.

Appl Opt. 2010 Jul 1;49(19):3821-30. doi: 10.1364/AO.49.003821.

PMID:
20648152
18.

Wavelength-scanning interferometry of a transparent parallel plate with refractive-index dispersion.

Hibino K, Oreb BF, Fairman PS.

Appl Opt. 2003 Jul 1;42(19):3888-95.

PMID:
12868827
19.

Influence of vibration disturbance during polarization coupling measurement of polarization-maintaining fiber.

Guo Z, Zhang H, Chen X, Jia D, Liu T.

Appl Opt. 2011 Jul 10;50(20):3553-8. doi: 10.1364/AO.50.003553.

PMID:
21743566
20.

Comparative study of central corneal thickness measurement with slit-lamp optical coherence tomography and visante optical coherence tomography.

Li H, Leung CK, Wong L, Cheung CY, Pang CP, Weinreb RN, Lam DS.

Ophthalmology. 2008 May;115(5):796-801.e2. Epub 2007 Oct 4.

PMID:
17916376
Format
Items per page
Sort by

Send to:

Choose Destination

Supplemental Content

Write to the Help Desk