Similar articles for PMID: 24189616

Year	Number of Results
1940	1
1992	1
1999	1
2000	2
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2005	2
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2012	15
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2014	12
2015	27
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2017	23
2018	16
2019	13
2020	15
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2022	4
2023	1
2024	0

1

3D analysis of advanced nano-devices using electron and atom probe tomography.

Grenier A, Duguay S, Barnes JP, Serra R, Haberfehlner G, Cooper D, Bertin F, Barraud S, Audoit G, Arnoldi L, Cadel E, Chabli A, Vurpillot F. Grenier A, et al. Ultramicroscopy. 2014 Jan;136:185-92. doi: 10.1016/j.ultramic.2013.10.001. Epub 2013 Oct 17. Ultramicroscopy. 2014. PMID: 24189616

2

Three-dimensional doping and diffusion in nano scaled devices as studied by atom probe tomography.

Kambham AK, Kumar A, Florakis A, Vandervorst W. Kambham AK, et al. Nanotechnology. 2013 Jul 12;24(27):275705. doi: 10.1088/0957-4484/24/27/275705. Epub 2013 Jun 14. Nanotechnology. 2013. PMID: 23764804

3

3D spatial resolution improvement by dual-axis electron tomography: application to tri-gate transistors.

Haberfehlner G, Serra R, Cooper D, Barraud S, Bleuet P. Haberfehlner G, et al. Ultramicroscopy. 2014 Jan;136:144-53. doi: 10.1016/j.ultramic.2013.09.006. Epub 2013 Oct 4. Ultramicroscopy. 2014. PMID: 24141183

4

On the interaction of an ultra-fast laser with a nanometric tip by laser assisted atom probe tomography: a review.

Vella A. Vella A. Ultramicroscopy. 2013 Sep;132:5-18. doi: 10.1016/j.ultramic.2013.05.016. Epub 2013 Jun 11. Ultramicroscopy. 2013. PMID: 23822883

5

Atom-probe for FinFET dopant characterization.

Kambham AK, Mody J, Gilbert M, Koelling S, Vandervorst W. Kambham AK, et al. Ultramicroscopy. 2011 May;111(6):535-9. doi: 10.1016/j.ultramic.2011.01.017. Epub 2011 Jan 18. Ultramicroscopy. 2011. PMID: 21288644

6

Three-Dimensional Nanoscale Mapping of State-of-the-Art Field-Effect Transistors (FinFETs).

Parikh P, Senowitz C, Lyons D, Martin I, Prosa TJ, DiBattista M, Devaraj A, Meng YS. Parikh P, et al. Microsc Microanal. 2017 Oct;23(5):916-925. doi: 10.1017/S1431927617012491. Epub 2017 Aug 31. Microsc Microanal. 2017. PMID: 28854989 Free article.

7

Atom probe trajectory mapping using experimental tip shape measurements.

Haley D, Petersen T, Ringer SP, Smith GD. Haley D, et al. J Microsc. 2011 Nov;244(2):170-80. doi: 10.1111/j.1365-2818.2011.03522.x. Epub 2011 Aug 4. J Microsc. 2011. PMID: 22004277

8

Atom scale characterization of the near apex region of an atomic force microscope tip.

Tourek CJ, Sundararajan S. Tourek CJ, et al. Microsc Microanal. 2010 Oct;16(5):636-42. doi: 10.1017/S1431927610000437. Epub 2010 Jul 30. Microsc Microanal. 2010. PMID: 20670465

9

Understanding Atom Probe Tomography of Oxide-Supported Metal Nanoparticles by Correlation with Atomic-Resolution Electron Microscopy and Field Evaporation Simulation.

Devaraj A, Colby R, Vurpillot F, Thevuthasan S. Devaraj A, et al. J Phys Chem Lett. 2014 Apr 17;5(8):1361-7. doi: 10.1021/jz500259c. Epub 2014 Mar 31. J Phys Chem Lett. 2014. PMID: 26269980

10

Imaging of radiation damage using complementary field ion microscopy and atom probe tomography.

Dagan M, Hanna LR, Xu A, Roberts SG, Smith GD, Gault B, Edmondson PD, Bagot PA, Moody MP. Dagan M, et al. Ultramicroscopy. 2015 Dec;159 Pt 2:387-94. doi: 10.1016/j.ultramic.2015.02.017. Epub 2015 Mar 2. Ultramicroscopy. 2015. PMID: 25794822

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