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Items: 1 to 20 of 144

1.

Quantitative annular dark field electron microscopy using single electron signals.

Ishikawa R, Lupini AR, Findlay SD, Pennycook SJ.

Microsc Microanal. 2014 Feb;20(1):99-110. doi: 10.1017/S1431927613013664. Epub 2013 Oct 29.

PMID:
24168987
2.

Experimental quantification of annular dark-field images in scanning transmission electron microscopy.

Lebeau JM, Stemmer S.

Ultramicroscopy. 2008 Nov;108(12):1653-8. doi: 10.1016/j.ultramic.2008.07.001. Epub 2008 Jul 15.

PMID:
18707809
3.

Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy.

Martinez GT, Rosenauer A, De Backer A, Verbeeck J, Van Aert S.

Ultramicroscopy. 2014 Feb;137:12-9. doi: 10.1016/j.ultramic.2013.11.001. Epub 2013 Nov 9.

PMID:
24270003
4.

Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting.

De Backer A, Martinez GT, MacArthur KE, Jones L, Béché A, Nellist PD, Van Aert S.

Ultramicroscopy. 2015 Apr;151:56-61. doi: 10.1016/j.ultramic.2014.11.028. Epub 2014 Dec 3.

PMID:
25511931
5.

Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy.

Van Aert S, Verbeeck J, Erni R, Bals S, Luysberg M, Van Dyck D, Van Tendeloo G.

Ultramicroscopy. 2009 Sep;109(10):1236-44. doi: 10.1016/j.ultramic.2009.05.010. Epub 2009 May 27.

PMID:
19525069
6.

Contributions to the contrast in experimental high-angle annular dark-field images.

Klenov DO, Stemmer S.

Ultramicroscopy. 2006 Aug-Sep;106(10):889-901. Epub 2006 Apr 25.

PMID:
16713091
7.

Simulation of atomic-scale high-angle annular dark field scanning transmission electron microscopy images.

Yamazaki T, Watanabe K, Recnik A, Ceh M, Kawasaki M, Shiojiri M.

J Electron Microsc (Tokyo). 2000;49(6):753-9.

PMID:
11270856
8.

Quantitative evaluation of annular bright-field phase images in STEM.

Ishida T, Kawasaki T, Tanji T, Ikuta T.

Microscopy (Oxf). 2015 Apr;64(2):121-8. doi: 10.1093/jmicro/dfu113. Epub 2015 Jan 7.

PMID:
25568080
10.

Atom counting in HAADF STEM using a statistical model-based approach: methodology, possibilities, and inherent limitations.

De Backer A, Martinez GT, Rosenauer A, Van Aert S.

Ultramicroscopy. 2013 Nov;134:23-33. doi: 10.1016/j.ultramic.2013.05.003. Epub 2013 May 17.

PMID:
23759467
11.

Measurement of specimen thickness and composition in Al(x)Ga(1-x)N/GaN using high-angle annular dark field images.

Rosenauer A, Gries K, Müller K, Pretorius A, Schowalter M, Avramescu A, Engl K, Lutgen S.

Ultramicroscopy. 2009 Aug;109(9):1171-82. doi: 10.1016/j.ultramic.2009.05.003. Epub 2009 May 14.

PMID:
19497670
12.

Quantification of sample thickness and in-concentration of InGaAs quantum wells by transmission measurements in a scanning electron microscope.

Volkenandt T, Müller E, Hu DZ, Schaadt DM, Gerthsen D.

Microsc Microanal. 2010 Oct;16(5):604-13. doi: 10.1017/S1431927610000292. Epub 2010 Jul 16.

PMID:
20633317
13.

Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy.

Krivanek OL, Chisholm MF, Nicolosi V, Pennycook TJ, Corbin GJ, Dellby N, Murfitt MF, Own CS, Szilagyi ZS, Oxley MP, Pantelides ST, Pennycook SJ.

Nature. 2010 Mar 25;464(7288):571-4. doi: 10.1038/nature08879.

PMID:
20336141
14.

Efficient elastic imaging of single atoms on ultrathin supports in a scanning transmission electron microscope.

Hovden R, Muller DA.

Ultramicroscopy. 2012 Dec;123:59-65. doi: 10.1016/j.ultramic.2012.04.014. Epub 2012 May 10.

PMID:
22727335
15.

Quantitative analysis of ultrathin doping layers in semiconductors using high-angle annular dark field images.

Liu CP, Preston AR, Boothroyd CB, Humphreys CJ.

J Microsc. 1999 Apr;194(1):171-182.

16.

Estimation of unknown structure parameters from high-resolution (S)TEM images: what are the limits?

den Dekker AJ, Gonnissen J, De Backer A, Sijbers J, Van Aert S.

Ultramicroscopy. 2013 Nov;134:34-43. doi: 10.1016/j.ultramic.2013.05.017. Epub 2013 Jun 1.

PMID:
23820594
17.

Direct imaging of hydrogen-atom columns in a crystal by annular bright-field electron microscopy.

Ishikawa R, Okunishi E, Sawada H, Kondo Y, Hosokawa F, Abe E.

Nat Mater. 2011 Apr;10(4):278-81. doi: 10.1038/nmat2957. Epub 2011 Feb 13.

PMID:
21317899
18.

Limits in detecting an individual dopant atom embedded in a crystal.

Mittal A, Mkhoyan KA.

Ultramicroscopy. 2011 Jul;111(8):1101-10. doi: 10.1016/j.ultramic.2011.03.002. Epub 2011 Mar 21.

PMID:
21741341
19.

Atomic imaging using secondary electrons in a scanning transmission electron microscope: experimental observations and possible mechanisms.

Inada H, Su D, Egerton RF, Konno M, Wu L, Ciston J, Wall J, Zhu Y.

Ultramicroscopy. 2011 Jun;111(7):865-76. doi: 10.1016/j.ultramic.2010.10.002. Epub 2010 Nov 11.

PMID:
21185651
20.

Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images.

E H, Macarthur KE, Pennycook TJ, Okunishi E, D'Alfonso AJ, Lugg NR, Allen LJ, Nellist PD.

Ultramicroscopy. 2013 Oct;133:109-19. doi: 10.1016/j.ultramic.2013.07.002. Epub 2013 Jul 15.

PMID:
23969066
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