Format
Items per page
Sort by

Send to:

Choose Destination

Results: 1 to 20 of 106

1.

On the optical stability of high-resolution transmission electron microscopes.

Barthel J, Thust A.

Ultramicroscopy. 2013 Nov;134:6-17. doi: 10.1016/j.ultramic.2013.05.001. Epub 2013 May 9.

PMID:
23830377
[PubMed - indexed for MEDLINE]
2.

Breaking the spherical and chromatic aberration barrier in transmission electron microscopy.

Freitag B, Kujawa S, Mul PM, Ringnalda J, Tiemeijer PC.

Ultramicroscopy. 2005 Feb;102(3):209-14.

PMID:
15639351
[PubMed - indexed for MEDLINE]
3.

Advances in atomic resolution in situ environmental transmission electron microscopy and 1A aberration corrected in situ electron microscopy.

Gai PL, Boyes ED.

Microsc Res Tech. 2009 Mar;72(3):153-64. doi: 10.1002/jemt.20668.

PMID:
19140163
[PubMed - indexed for MEDLINE]
4.

Sub-ångstrom resolution using aberration corrected electron optics.

Batson PE, Dellby N, Krivanek OL.

Nature. 2002 Aug 8;418(6898):617-20.

PMID:
12167855
[PubMed]
5.

Determination of aberration center of Ronchigram for automated aberration correctors in scanning transmission electron microscopy.

Sannomiya T, Sawada H, Nakamichi T, Hosokawa F, Nakamura Y, Tanishiro Y, Takayanagi K.

Ultramicroscopy. 2013 Dec;135:71-9. doi: 10.1016/j.ultramic.2013.05.024. Epub 2013 Jun 19.

PMID:
23911859
[PubMed]
6.

Seeing atoms with aberration-corrected sub-Angström electron microscopy.

O'Keefe MA.

Ultramicroscopy. 2008 Feb;108(3):196-209. Epub 2007 Oct 18.

PMID:
18054170
[PubMed]
7.

Low-dose aberration corrected cryo-electron microscopy of organic specimens.

Evans JE, Hetherington C, Kirkland A, Chang LY, Stahlberg H, Browning N.

Ultramicroscopy. 2008 Nov;108(12):1636-44. doi: 10.1016/j.ultramic.2008.06.004. Epub 2008 Jul 1.

PMID:
18703285
[PubMed - indexed for MEDLINE]
Free PMC Article
8.

Sub-angstrom low-voltage performance of a monochromated, aberration-corrected transmission electron microscope.

Bell DC, Russo CJ, Benner G.

Microsc Microanal. 2010 Aug;16(4):386-92. doi: 10.1017/S1431927610093670. Epub 2010 Jul 2.

PMID:
20598206
[PubMed]
Free PMC Article
9.

Current and future aberration correctors for the improvement of resolution in electron microscopy.

Haider M, Hartel P, Müller H, Uhlemann S, Zach J.

Philos Trans A Math Phys Eng Sci. 2009 Sep 28;367(1903):3665-82. doi: 10.1098/rsta.2009.0121.

PMID:
19687059
[PubMed]
10.

Upper limits for the residual aberrations of a high-resolution aberration-corrected STEM

Haider M, Uhlemann S, Zach J.

Ultramicroscopy. 2000 Apr;81(3-4):163-75.

PMID:
10782641
[PubMed - as supplied by publisher]
11.

Three-dimensional optical transfer functions in the aberration-corrected scanning transmission electron microscope.

Jones L, Nellist PD.

J Microsc. 2014 May;254(2):47-64. doi: 10.1111/jmi.12117. Epub 2014 Mar 11.

PMID:
24617853
[PubMed - in process]
12.

Intrinsic instability of aberration-corrected electron microscopes.

Schramm SM, van der Molen SJ, Tromp RM.

Phys Rev Lett. 2012 Oct 19;109(16):163901. Epub 2012 Oct 15.

PMID:
23215077
[PubMed]
13.

Background, status and future of the Transmission Electron Aberration-corrected Microscope project.

Dahmen U, Erni R, Radmilovic V, Ksielowski C, Rossell MD, Denes P.

Philos Trans A Math Phys Eng Sci. 2009 Sep 28;367(1903):3795-808. doi: 10.1098/rsta.2009.0094.

PMID:
19687066
[PubMed]
14.

Progress and perspectives for atomic-resolution electron microscopy.

Smith DJ.

Ultramicroscopy. 2008 Feb;108(3):159-66. Epub 2007 Oct 22. Review.

PMID:
18054169
[PubMed - indexed for MEDLINE]
15.

Imaging single atoms using secondary electrons with an aberration-corrected electron microscope.

Zhu Y, Inada H, Nakamura K, Wall J.

Nat Mater. 2009 Oct;8(10):808-12. doi: 10.1038/nmat2532. Epub 2009 Sep 20.

PMID:
19767737
[PubMed]
16.

Low voltage transmission electron microscopy of graphene.

Bachmatiuk A, Zhao J, Gorantla SM, Martinez IG, Wiedermann J, Lee C, Eckert J, Rummeli MH.

Small. 2015 Feb;11(5):515-42. doi: 10.1002/smll.201401804. Epub 2014 Nov 18.

PMID:
25408379
[PubMed - in process]
17.

Extended depth of field for high-resolution scanning transmission electron microscopy.

Hovden R, Xin HL, Muller DA.

Microsc Microanal. 2011 Feb;17(1):75-80. doi: 10.1017/S1431927610094171. Epub 2010 Dec 2.

PMID:
21122192
[PubMed]
18.

A demonstration of the effectiveness of a single aberration correction per optical slice in beam scanned optically sectioning microscopes.

Poland SP, Wright AJ, Cobb S, Vijverberg JC, Girkin JM.

Micron. 2011 Jun;42(4):318-23. doi: 10.1016/j.micron.2010.05.018. Epub 2010 Sep 22.

PMID:
20932768
[PubMed - in process]
19.

Multi-dimensional and multi-signal approaches in scanning transmission electron microscopes.

Colliex C, Brun N, Gloter A, Imhoff D, Kociak M, March K, Mory C, Stéphan O, Tencé M, Walls M.

Philos Trans A Math Phys Eng Sci. 2009 Sep 28;367(1903):3845-58. doi: 10.1098/rsta.2009.0128.

PMID:
19687069
[PubMed]
20.

Prospects for aberration-free electron microscopy.

Rose H.

Ultramicroscopy. 2005 Apr;103(1):1-6. Epub 2005 Jan 19.

PMID:
15777594
[PubMed]
Format
Items per page
Sort by

Send to:

Choose Destination

Supplemental Content

Write to the Help Desk