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Similar articles for PubMed (Select 23586267)

1.

[Measurement of relative spectral responsivity of photodetector by LED-based spectrum-tunable source].

Liu HX, Ren JW, Wan Z, Liu ZX, Li BY, Ye Z.

Guang Pu Xue Yu Guang Pu Fen Xi. 2013 Jan;33(1):250-4. Chinese.

PMID:
23586267
2.

Measurement of normalized spectral responsivity of digital imaging devices by using a LED-based tunable uniform source.

Mahmoud K, Park S, Park SN, Lee DH.

Appl Opt. 2013 Feb 20;52(6):1263-71. doi: 10.1364/AO.52.001263.

PMID:
23434998
3.

Facility for spectral irradiance and radiance responsivity calibrations using uniform sources.

Brown SW, Eppeldauer GP, Lykke KR.

Appl Opt. 2006 Nov 10;45(32):8218-37.

PMID:
17068565
4.

Differential spectral responsivity measurement of photovoltaic detectors with a light-emitting-diode-based integrating sphere source.

Zaid G, Park SN, Park S, Lee DH.

Appl Opt. 2010 Dec 10;49(35):6772-83. doi: 10.1364/AO.49.006772.

PMID:
21151235
5.

Spectral reflectance and responsivity of Ge- and InGaAs-photodiodes in the near-infrared: measurement and model.

López M, Hofer H, Stock KD, Bermúdez JC, Schirmacher A, Schneck F, Kück S.

Appl Opt. 2007 Oct 10;46(29):7337-44.

PMID:
17932548
6.

Comparison of absolute spectral irradiance responsivity measurement techniques using wavelength-tunable lasers.

Ahtee V, Brown SW, Larason TC, Lykke KR, Ikonen E, Noorma M.

Appl Opt. 2007 Jul 10;46(20):4228-36.

PMID:
17579678
7.

Si-based tunable flattop photodetector with a stepped Fabry-Perot cavity.

Wang W, Huang Y, Duan X, Tian J, Guo J, Ren X.

Appl Opt. 2012 Apr 1;51(10):1487-94. doi: 10.1364/AO.51.001487.

PMID:
22505066
8.

Validation of short-pulse-laser-based measurement setup for absolute spectral irradiance responsivity calibration.

Schuster M, Nevas S, Sperling A.

Appl Opt. 2014 May 1;53(13):2815-21. doi: 10.1364/AO.53.002815.

PMID:
24921865
9.

[A new non-contact method based on relative spectral intensity for determining junction temperature of LED].

Qiu XZ, Zhang FH.

Guang Pu Xue Yu Guang Pu Fen Xi. 2013 Jan;33(1):36-9. Chinese.

PMID:
23586219
10.
11.

Absolute quantum yield measurement of powder samples.

Moreno LA.

J Vis Exp. 2012 May 12;(63):e3066. doi: 10.3791/3066.

12.

Measurement of LED chips using a large-area silicon photodiode.

Chou PT, Ying SP, Chen TT, Fu HK, Wang CP, Lee CK.

Appl Opt. 2014 Oct 10;53(29):H44-50. doi: 10.1364/AO.53.000H44.

PMID:
25322430
13.

New wavelength-fitting algorithm of CCD in the circumstance of grating rotation.

Li H, Fu S, Xu X, Wang B, Wang M, Sun X, Huang S, Guo T, Zhao C, Wang Y.

Appl Opt. 2014 Jul 20;53(21):4729-33. doi: 10.1364/AO.53.004729.

PMID:
25090210
14.
15.

[Measurement technology for relative spectral responsivity of the ultraviolet ICCD].

Zhao YH, Yan F, Lou HW, Sui YX, Yang HJ, Cao JL.

Guang Pu Xue Yu Guang Pu Fen Xi. 2009 May;29(5):1371-4. Chinese.

PMID:
19650492
16.

[Development of transient pyrometer based on multi-spectral radiation technology].

Zhai Y, Shen H, Zhu RH, Ma SD, Li JX, Chen L, Gu JL.

Guang Pu Xue Yu Guang Pu Fen Xi. 2010 Nov;30(11):3161-5. Chinese.

PMID:
21284205
17.

Calibration of 254-nm irradiance based on the silicon photodiode self-calibration technique.

Ohkubo K, Ohno Y, Nakagawa Y.

Appl Opt. 1993 Sep 1;32(25):4815-21. doi: 10.1364/AO.32.004815.

PMID:
20830150
18.

Absolute spectral responsivity measurements of solar cells by a hybrid optical technique.

Hamadani BH, Roller J, Dougherty B, Persaud F, Yoon HW.

Appl Opt. 2013 Jul 20;52(21):5184-93. doi: 10.1364/AO.52.005184.

PMID:
23872765
19.

Systematic intensity errors caused by spectral truncation: origin and remedy.

Lenstra AT, Van Loock JF, Rousseau B, Maes ST.

Acta Crystallogr A. 2001 Nov;57(Pt 6):629-41. Epub 2001 Oct 26.

PMID:
11679692
20.

[Research on absolute calibration of sun channel of sun photometer using laser raster scanning method].

Xu WB, Li JJ, Zheng XB.

Guang Pu Xue Yu Guang Pu Fen Xi. 2013 Jan;33(1):255-60. Chinese.

PMID:
23586268
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