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Items: 1 to 20 of 117

1.

Micromachined silicon grisms for infrared optics.

Mar DJ, Marsh JP, Deen CP, Ling H, Choo H, Jaffe DT.

Appl Opt. 2009 Feb 20;48(6):1016-29.

PMID:
23567560
2.

Fabrication and evaluation of an etched infrared diffraction grating.

Graf UU, Jaffe DT, Kim EJ, Lacy JH, Ling H, Moore JT, Rebeiz G.

Appl Opt. 1994 Jan 1;33(1):96-102. doi: 10.1364/AO.33.000096.

PMID:
20861994
3.

Production and evaluation of silicon immersion gratings for infrared astronomy.

Marsh JP, Mar DJ, Jaffe DT.

Appl Opt. 2007 Jun 10;46(17):3400-16.

PMID:
17514298
4.

Fabrication and testing of chemically micromachined silicon echelle gratings.

Keller LD, Jaffe DT, Ershov OA, Benedict T, Graf UU.

Appl Opt. 2000 Mar 1;39(7):1094-105.

PMID:
18337989
5.
6.

Diffraction efficiency of 200-nm-period critical-angle transmission gratings in the soft x-ray and extreme ultraviolet wavelength bands.

Heilmann RK, Ahn M, Bruccoleri A, Chang CH, Gullikson EM, Mukherjee P, Schattenburg ML.

Appl Opt. 2011 Apr 1;50(10):1364-73. doi: 10.1364/AO.50.001364.

PMID:
21460902
7.

Heterogeneously integrated silicon photonics for the mid-infrared and spectroscopic sensing.

Chen Y, Lin H, Hu J, Li M.

ACS Nano. 2014 Jul 22;8(7):6955-61.

PMID:
24884013
8.

Preferential chemical etching of blazed gratings in (110)-oriented GaAs.

Shams MK, Botez D, Wang S.

Opt Lett. 1979 Mar 1;4(3):96-8.

PMID:
19687812
9.

Optimizing and characterizing grating efficiency for a soft X-ray emission spectrometer.

Boots M, Muir D, Moewes A.

J Synchrotron Radiat. 2013 Mar;20(Pt 2):272-85. doi: 10.1107/S0909049512051266. Epub 2013 Feb 6.

PMID:
23412484
10.

Rectangular-profile diffraction grating from single-crystal silicon.

Josse M, Kendall DL.

Appl Opt. 1980 Jan 1;19(1):72-6. doi: 10.1364/AO.19.000072.

PMID:
20216796
11.

Resonant grating polarizers made with silicon nitride, titanium dioxide, and silicon: design, fabrication, and characterization.

Lee KJ, Giese J, Ajayi L, Magnusson R, Johnson E.

Opt Express. 2014 Apr 21;22(8):9271-81. doi: 10.1364/OE.22.009271.

PMID:
24787815
12.

Microspectrometer with slab-waveguide transmission gratings.

Sander D, Blume O, Möller J.

Appl Opt. 1996 Jul 20;35(21):4096-101. doi: 10.1364/AO.35.004096.

PMID:
21102814
13.

Blazed high-efficiency x-ray diffraction via transmission through arrays of nanometer-scale mirrors.

Heilmann RK, Ahn M, Gullikson EM, Schattenburg ML.

Opt Express. 2008 Jun 9;16(12):8658-69.

PMID:
18545579
14.

Blaze characteristics of echelle gratings.

Engman S, Lindblom P.

Appl Opt. 1982 Dec 1;21(23):4356-62. doi: 10.1364/AO.21.004356.

PMID:
20401070
16.

Comparison of the calculated and the measured efficiencies of a normal-incidence grating in the 125-225- A wavelength range.

Kowalski MP, Seely JF, Goray LI, Hunter WR, Rife JC.

Appl Opt. 1997 Dec 1;36(34):8939-43.

PMID:
18264447
17.

Near infrared rugate filter fabrication by ion beam assisted deposition of Si((1-x))N(x) films.

Donovan EP, Van Vechten D, Kahn AD, Carosella CA, Hubler GK.

Appl Opt. 1989 Jul 15;28(14):2940-4. doi: 10.1364/AO.28.002940.

PMID:
20555627
18.

Chip-scale Mid-Infrared chemical sensors using air-clad pedestal silicon waveguides.

Lin PT, Singh V, Hu J, Richardson K, Musgraves JD, Luzinov I, Hensley J, Kimerling LC, Agarwal A.

Lab Chip. 2013 Jun 7;13(11):2161-6. doi: 10.1039/c3lc50177a.

PMID:
23620303
19.

Applications of microstructured silicon wafers as internal reflection elements in attenuated total reflection Fourier transform infrared spectroscopy.

Schumacher H, Künzelmann U, Vasilev B, Eichhorn KJ, Bartha JW.

Appl Spectrosc. 2010 Sep;64(9):1022-7. doi: 10.1366/000370210792434404.

PMID:
20828439
20.

Efficiency measurements of reflection gratings in the 100-300-A band.

Meekins JF, Kowalski MP, Cruddace RG.

Appl Opt. 1989 Apr 1;28(7):1369-77. doi: 10.1364/AO.28.001369.

PMID:
20548666
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