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Items: 1 to 20 of 91

1.

Nondestructive and nonpreparative chemical nanometrology of internal material interfaces at tunable high information depths.

Pollakowski B, Hoffmann P, Kosinova M, Baake O, Trunova V, Unterumsberger R, Ensinger W, Beckhoff B.

Anal Chem. 2013 Jan 2;85(1):193-200. doi: 10.1021/ac3024872. Epub 2012 Dec 18.

PMID:
23249359
2.
3.

Chemical interactions in the layered system BCxNy/Ni(Cu)/Si, produced by CVD at high temperature.

Hoffmann PS, Kosinova MI, Flege S, Baake O, Pollakowski B, Trunova VA, Klein A, Beckhoff B, Kuznetsov FA, Ensinger W.

Anal Bioanal Chem. 2012 Aug;404(2):479-87. doi: 10.1007/s00216-012-6177-2. Epub 2012 Jun 13.

PMID:
22692593
4.

Combined evaluation of grazing incidence X-ray fluorescence and X-ray reflectivity data for improved profiling of ultra-shallow depth distributions.

Ingerle D, Meirer F, Pepponi G, Demenev E, Giubertoni D, Wobrauschek P, Streli C.

Spectrochim Acta Part B At Spectrosc. 2014 Sep 1;99(100):121-128.

5.

Stability of high temperature chemical vapor deposited silicon based structures on metals for solar conversion.

Gelard I, Chichignoud G, Blanquet E, Xuan HN, Cruz R, Jimenez C, Sarigiannidou E, Zaidat K.

J Nanosci Nanotechnol. 2011 Sep;11(9):8318-22.

PMID:
22097576
6.

Microstructure of Mo/Si multilayers with B4C diffusion barrier layers.

Nedelcu I, van de Kruijs RW, Yakshin AE, Bijkerk F.

Appl Opt. 2009 Jan 10;48(2):155-60.

PMID:
19137023
7.

Secondary ion mass spectrometry and X-ray photoelectron spectroscopy investigation on chemical vapor deposited CeO(2-)ZrO(2)-TiO(2) thin films.

Barison S, Barreca D, Battiston GA, Daolio S, Fabrizio M, Gerbasi R, Tondello E.

Rapid Commun Mass Spectrom. 2003;17(9):996-1001.

PMID:
12717775
8.

Complementary characterization of buried nanolayers by quantitative X-ray fluorescence spectrometry under conventional and grazing incidence conditions.

Unterumsberger R, Pollakowski B, Müller M, Beckhoff B.

Anal Chem. 2011 Nov 15;83(22):8623-8. doi: 10.1021/ac202074s. Epub 2011 Oct 25.

PMID:
21961904
9.

Grazing incidence-X-ray fluorescence spectrometry for the compositional analysis of nanometer-thin high-kappa dielectric HfO2 layers.

Hellin D, Delabie A, Puurunen RL, Beaven P, Conard T, Brijs B, De Gendt S, Vinckier C.

Anal Sci. 2005 Jul;21(7):845-50.

10.

Analytical characterization of BC(x)N(y) films generated by LPCVD with triethylamine borane.

Baake O, Hoffmann PS, Kosinova ML, Klein A, Pollakowski B, Beckhoff B, Fainer NI, Trunova VA, Ensinger W.

Anal Bioanal Chem. 2010 Sep;398(2):1077-84. doi: 10.1007/s00216-010-3965-4. Epub 2010 Jul 6.

PMID:
20607521
11.
12.
13.

Quantitative determination of absolute organohalogen concentrations in environmental samples by X-ray absorption spectroscopy.

Leri AC, Hay MB, Lanzirotti A, Rao W, Myneni SC.

Anal Chem. 2006 Aug 15;78(16):5711-8.

PMID:
16906715
14.

Ultrafast soft X-ray photoelectron spectroscopy at liquid water microjets.

Faubel M, Siefermann KR, Liu Y, Abel B.

Acc Chem Res. 2012 Jan 17;45(1):120-30. doi: 10.1021/ar200154w. Epub 2011 Nov 10.

PMID:
22075058
15.

Quantitative chemical imaging of element diffusion into heterogeneous media using laser ablation inductively coupled plasma mass spectrometry, synchrotron micro-X-ray fluorescence, and extended X-ray absorption fine structure spectroscopy.

Wang HA, Grolimund D, Van Loon LR, Barmettler K, Borca CN, Aeschlimann B, Günther D.

Anal Chem. 2011 Aug 15;83(16):6259-66. doi: 10.1021/ac200899x. Epub 2011 Jul 15.

PMID:
21623637
16.

Quantification of corrosion phenomena in plastic processing machines.

Kemmler B, Hoffmann P, Cremer M, Ortner HM, Mennig G.

Fresenius J Anal Chem. 2001 Nov;371(6):874-81.

PMID:
11768480
17.

Nanoscale characterization of the dielectric charging phenomenon in PECVD silicon nitride thin films with various interfacial structures based on Kelvin probe force microscopy.

Zaghloul U, Papaioannou GJ, Wang H, Bhushan B, Coccetti F, Pons P, Plana R.

Nanotechnology. 2011 May 20;22(20):205708. doi: 10.1088/0957-4484/22/20/205708. Epub 2011 Mar 28.

PMID:
21444948
18.

Structural and chemical characterization of TiO2 memristive devices by spatially-resolved NEXAFS.

Strachan JP, Joshua Yang J, Münstermann R, Scholl A, Medeiros-Ribeiro G, Stewart DR, Stanley Williams R.

Nanotechnology. 2009 Dec 2;20(48):485701. doi: 10.1088/0957-4484/20/48/485701. Epub 2009 Oct 30.

PMID:
19880979
19.

Investigation of Ti layer thickness dependent structural, magnetic, and photoemission study of nanometer range Ti/Ni multilayer structures.

Bhatt P, Prakash R, Chaudhari SM, Reddy VR, Phase DM.

J Nanosci Nanotechnol. 2007 Jun;7(6):2081-6.

PMID:
17654996
20.

Chemical characterization of DNA-immobilized InAs surfaces using X-ray photoelectron spectroscopy and near-edge X-ray absorption fine structure.

Cho E, Brown A, Kuech TF.

Langmuir. 2012 Aug 14;28(32):11890-8. doi: 10.1021/la302313v. Epub 2012 Jul 31.

PMID:
22809291
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