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Items: 1 to 20 of 142

1.

Complex design of dissipation signals in non-contact atomic force microscopy.

Bamidele J, Li YJ, Jarvis S, Naitoh Y, Sugawara Y, Kantorovich L.

Phys Chem Chem Phys. 2012 Dec 21;14(47):16250-7. doi: 10.1039/c2cp43121a. Epub 2012 Oct 31.

PMID:
23111800
2.

A measurement of the hysteresis loop in force-spectroscopy curves using a tuning-fork atomic force microscope.

Lange M, van Vörden D, Möller R.

Beilstein J Nanotechnol. 2012;3:207-12. doi: 10.3762/bjnano.3.23. Epub 2012 Mar 8.

3.

Modelling the manipulation of C60 on the Si001 surface performed with NC-AFM.

Martsinovich N, Kantorovich L.

Nanotechnology. 2009 Apr 1;20(13):135706. doi: 10.1088/0957-4484/20/13/135706. Epub 2009 Mar 11.

PMID:
19420515
4.

Ab initio simulation of atomic-scale imaging in noncontact atomic force microscopy.

Caciuc V, Hölscher H.

Nanotechnology. 2009 Jul 1;20(26):264006. doi: 10.1088/0957-4484/20/26/264006. Epub 2009 Jun 10.

PMID:
19509458
5.

Models of atomic scale contrast in dissipation images of binary ionic surfaces in non-contact atomic force microscopy.

Trevethan T, Kantorovich L.

Nanotechnology. 2006 Apr 14;17(7):S205-12. doi: 10.1088/0957-4484/17/7/S18. Epub 2006 Mar 10.

PMID:
21727416
6.

Nano-mechanical exploration of the surface and sub-surface of hydrated cells of Staphylococcus epidermidis.

Méndez-Vilas A, Gallardo-Moreno AM, González-Martín ML.

Antonie Van Leeuwenhoek. 2006 Apr-May;89(3-4):373-86. Epub 2006 Apr 25.

PMID:
16779634
7.

Structural development and energy dissipation in simulated silicon apices.

Jarvis SP, Kantorovich L, Moriarty P.

Beilstein J Nanotechnol. 2013 Dec 20;4:941-8. doi: 10.3762/bjnano.4.106. eCollection 2013 Dec 20.

8.

The role of the tip in non-contact atomic force microscopy dissipation images of ionic surfaces.

Federici Canova F, Foster AS.

Nanotechnology. 2011 Jan 28;22(4):045702. doi: 10.1088/0957-4484/22/4/045702. Epub 2010 Dec 15.

PMID:
21157016
9.

Contrast inversion in non-contact atomic force microscopy imaging of C60 molecules.

Loske F, Rahe P, Kühnle A.

Nanotechnology. 2009 Jul 1;20(26):264010. doi: 10.1088/0957-4484/20/26/264010. Epub 2009 Jun 10.

PMID:
19509449
10.

High-resolution noncontact atomic force microscopy.

Pérez R, García R, Schwarz U.

Nanotechnology. 2009 Jul 1;20(26):260201. doi: 10.1088/0957-4484/20/26/260201. Epub 2009 Jun 10.

PMID:
19531843
11.

Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe.

Sweetman A, Jarvis S, Danza R, Moriarty P.

Beilstein J Nanotechnol. 2012;3:25-32. doi: 10.3762/bjnano.3.3. Epub 2012 Jan 9.

12.

'Sub-atomic' resolution of non-contact atomic force microscope images induced by a heterogeneous tip structure: a density functional theory study.

Campbellová A, Ondráček M, Pou P, Pérez R, Klapetek P, Jelínek P.

Nanotechnology. 2011 Jul 22;22(29):295710. doi: 10.1088/0957-4484/22/29/295710. Epub 2011 Jun 20.

PMID:
21685559
13.

Velocity dependent friction laws in contact mode atomic force microscopy.

Stark RW, Schitter G, Stemmer A.

Ultramicroscopy. 2004 Aug;100(3-4):309-17.

PMID:
15231324
15.

Structure and stability of semiconductor tip apexes for atomic force microscopy.

Pou P, Ghasemi SA, Jelinek P, Lenosky T, Goedecker S, Perez R.

Nanotechnology. 2009 Jul 1;20(26):264015. doi: 10.1088/0957-4484/20/26/264015. Epub 2009 Jun 10.

PMID:
19509446
16.
17.

NC-AFM imaging of the TiO(2)(110)-(1 x 1) surface at low temperature.

Yurtsever A, Sugimoto Y, Abe M, Morita S.

Nanotechnology. 2010 Apr 23;21(16):165702. doi: 10.1088/0957-4484/21/16/165702. Epub 2010 Mar 26.

PMID:
20348596
18.
19.

Measuring phase shifts and energy dissipation with amplitude modulation atomic force microscopy.

Martínez NF, García R.

Nanotechnology. 2006 Apr 14;17(7):S167-72. doi: 10.1088/0957-4484/17/7/S11. Epub 2006 Mar 10.

PMID:
21727409
20.

Highly resolved non-contact atomic force microscopy images of the Sn/Si(111)-([Formula: see text]) surface.

Sugimoto Y, Abe M, Hirayama S, Morita S.

Nanotechnology. 2006 Aug 28;17(16):4235-9. doi: 10.1088/0957-4484/17/16/039. Epub 2006 Aug 1.

PMID:
21727565
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