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Items: 1 to 20 of 230

1.

Experimental evaluation of interfaces using atomic-resolution high angle annular dark field (HAADF) imaging.

Robb PD, Finnie M, Longo P, Craven AJ.

Ultramicroscopy. 2012 Mar;114:11-9. doi: 10.1016/j.ultramic.2011.10.015. Epub 2011 Nov 4.

PMID:
22343667
2.

Column ratio mapping: a processing technique for atomic resolution high-angle annular dark-field (HAADF) images.

Robb PD, Craven AJ.

Ultramicroscopy. 2008 Dec;109(1):61-9. doi: 10.1016/j.ultramic.2008.08.001. Epub 2008 Aug 12.

PMID:
18814971
3.

Modelling of AlAs/GaAs interfacial structures using high-angle annular dark field (HAADF) image simulations.

Robb PD, Finnie M, Craven AJ.

Ultramicroscopy. 2012 Jul;118:53-60. doi: 10.1016/j.ultramic.2012.05.001. Epub 2012 May 14.

PMID:
22728405
4.

Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy.

Van Aert S, Verbeeck J, Erni R, Bals S, Luysberg M, Van Dyck D, Van Tendeloo G.

Ultramicroscopy. 2009 Sep;109(10):1236-44. doi: 10.1016/j.ultramic.2009.05.010. Epub 2009 May 27.

PMID:
19525069
5.

Prospects of atomic resolution imaging with an aberration-corrected STEM.

Ishizuka K.

J Electron Microsc (Tokyo). 2001;50(4):291-305.

PMID:
11592674
6.

Simulation of atomic-scale high-angle annular dark field scanning transmission electron microscopy images.

Yamazaki T, Watanabe K, Recnik A, Ceh M, Kawasaki M, Shiojiri M.

J Electron Microsc (Tokyo). 2000;49(6):753-9.

PMID:
11270856
7.

Quantitative analysis of interfacial strain in InAs/GaSb superlattices by aberration-corrected HRTEM and HAADF-STEM.

Mahalingam K, Haugan HJ, Brown GJ, Eyink KG.

Ultramicroscopy. 2013 Apr;127:70-5. doi: 10.1016/j.ultramic.2012.09.005. Epub 2012 Dec 8.

PMID:
23298538
8.

Effect of chromatic aberration on atomic-resolved spherical aberration corrected STEM images.

Kuramochi K, Yamazaki T, Kotaka Y, Ohtsuka M, Hashimoto I, Watanabe K.

Ultramicroscopy. 2009 Dec;110(1):36-42. doi: 10.1016/j.ultramic.2009.09.003. Epub 2009 Sep 17.

PMID:
19818560
9.

Compositional analysis with atomic column spatial resolution by 5th-order aberration-corrected scanning transmission electron microscopy.

Hernández-Maldonado D, Herrera M, Alonso-González P, González Y, González L, Gazquez J, Varela M, Pennycook SJ, Guerrero-Lebrero Mde L, Pizarro J, Galindo PL, Molina SI.

Microsc Microanal. 2011 Aug;17(4):578-81. doi: 10.1017/S1431927611000213. Epub 2011 May 27.

PMID:
21615979
10.

Surface channeling in aberration-corrected scanning transmission electron microscopy of nanostructures.

Liu J, Allard LF.

Microsc Microanal. 2010 Aug;16(4):425-33. doi: 10.1017/S1431927610000450. Epub 2010 Jul 2.

PMID:
20598201
11.

A practical approach for STEM image simulation based on the FFT multislice method.

Ishizuka K.

Ultramicroscopy. 2001 Feb;90(2-3):71-83.

PMID:
11942640
12.

Retrieval process of high-resolution HAADF-STEM images.

Nakanishi N, Yamazaki T, Recnik A, Ceh M, Kawasaki M, Watanabe K, Shiojiri M.

J Electron Microsc (Tokyo). 2002;51(6):383-90.

PMID:
12630781
13.

IMAGE-WARP: a real-space restoration method for high-resolution STEM images using quantitative HRTEM analysis.

Recnik A, Möbus G, Sturm S.

Ultramicroscopy. 2005 Jul;103(4):285-301. Epub 2005 Mar 14.

PMID:
15885433
14.

Contributions to the contrast in experimental high-angle annular dark-field images.

Klenov DO, Stemmer S.

Ultramicroscopy. 2006 Aug-Sep;106(10):889-901. Epub 2006 Apr 25.

PMID:
16713091
15.

Characterisation of InAs/GaAs short period superlattices using column ratio mapping in aberration-corrected scanning transmission electron microscopy.

Robb PD, Finnie M, Craven AJ.

Micron. 2012 Oct;43(10):1068-72. doi: 10.1016/j.micron.2012.04.018. Epub 2012 May 14.

PMID:
22633853
16.

Effects of specimen tilt in ADF-STEM imaging of a-Si/c-Si interfaces.

Yu Z, Muller DA, Silcox J.

Ultramicroscopy. 2008 Apr;108(5):494-501. Epub 2007 Aug 14.

PMID:
17920197
17.

Extraction of structural and chemical information from high angle annular dark-field image by an improved peaks finding method.

Yin W, Huang R, Qi R, Duan C.

Microsc Res Tech. 2016 Sep;79(9):820-6. doi: 10.1002/jemt.22704. Epub 2016 Jun 21.

PMID:
27324521
18.

Application of two-dimensional crystallography and image processing to atomic resolution Z-contrast images.

Morgan DG, Ramasse QM, Browning ND.

J Electron Microsc (Tokyo). 2009 Jun;58(3):223-44. doi: 10.1093/jmicro/dfp007. Epub 2009 Mar 17.

PMID:
19297343
19.

Lattice imaging in low-angle and high-angle bright-field scanning transmission electron microscopy.

Watanabe K, Kikuchi Y, Yamazaki T, Asano E, Nakanishi N, Kotaka Y, Okunishi E, Hashimoto I.

Acta Crystallogr A. 2004 Nov;60(Pt 6):591-7. Epub 2004 Oct 26.

PMID:
15507742
20.

Atomic resolution imaging using the real-space distribution of electrons scattered by a crystalline material.

Lazar S, Etheridge J, Dwyer C, Freitag B, Botton GA.

Acta Crystallogr A. 2011 Sep;67(Pt 5):487-90. doi: 10.1107/S0108767311020708. Epub 2011 Jul 6.

PMID:
21844654
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