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Items: 1 to 20 of 107

1.

Extensive studies on linear growth processes with spatiotemporally correlated noise in arbitrary substrate dimensions.

Pang NN, Tzeng WJ.

Phys Rev E Stat Nonlin Soft Matter Phys. 2010 Sep;82(3 Pt 1):031605. Epub 2010 Sep 17.

PMID:
21230084
2.

Superroughening by linear growth equations with spatiotemporally correlated noise.

Pang NN, Tzeng WJ.

Phys Rev E Stat Nonlin Soft Matter Phys. 2004 Jul;70(1 Pt 1):011105. Epub 2004 Jul 30.

PMID:
15324040
3.

Interfaces with superroughness

Pang NN, Tzeng WJ.

Phys Rev E Stat Phys Plasmas Fluids Relat Interdiscip Topics. 2000 Apr;61(4 Pt A):3559-63.

PMID:
11088132
4.

Macromolecular crowding: chemistry and physics meet biology (Ascona, Switzerland, 10-14 June 2012).

Foffi G, Pastore A, Piazza F, Temussi PA.

Phys Biol. 2013 Aug 2;10(4):040301. [Epub ahead of print]

PMID:
23912807
5.

Dynamics of growing surfaces by linear equations in 2+1 dimensions.

Pang NN, Li WJ, Chang YC, Tzeng WJ, Wang J.

Phys Rev E Stat Nonlin Soft Matter Phys. 2007 Jan;75(1 Pt 1):011603. Epub 2007 Jan 17.

PMID:
17358163
6.

Anomalous scaling of superrough growing surfaces: from correlation functions to residual local interfacial widths and scaling exponents.

Pang NN, Tzeng WJ.

Phys Rev E Stat Nonlin Soft Matter Phys. 2004 Sep;70(3 Pt 2):036115. Epub 2004 Sep 24.

PMID:
15524595
7.

Roughness scaling in cyclical surface growth.

Raychaudhuri S, Shapir Y, Foster DG, Jorne J.

Phys Rev E Stat Nonlin Soft Matter Phys. 2001 Nov;64(5 Pt 1):051604. Epub 2001 Oct 22.

PMID:
11735936
8.

Local diffusion induced roughening in cobalt phthalocyanine thin film growth.

Gedda M, Subbarao NV, Goswami DK.

Langmuir. 2014 Jul 29;30(29):8735-40. doi: 10.1021/la502108a. Epub 2014 Jul 15.

PMID:
24992503
9.

Restricted curvature model with suppression of extremal height.

Jeong HC, Kim JM.

Phys Rev E Stat Nonlin Soft Matter Phys. 2002 Nov;66(5 Pt 1):051605. Epub 2002 Nov 26.

PMID:
12513496
10.

Directed avalanche processes with underlying interface dynamics.

Chen CC, den Nijs M.

Phys Rev E Stat Nonlin Soft Matter Phys. 2002 Jul;66(1 Pt 1):011306. Epub 2002 Jul 24.

PMID:
12241353
11.

Relaxation after a change in the interface growth dynamics.

de Assis TA, Aarão Reis FD.

Phys Rev E Stat Nonlin Soft Matter Phys. 2014 Jun;89(6):062405. Epub 2014 Jun 13.

PMID:
25019792
12.

Finite-size effects in roughness distribution scaling.

Oliveira TJ, Aarão Reis FD.

Phys Rev E Stat Nonlin Soft Matter Phys. 2007 Dec;76(6 Pt 1):061601. Epub 2007 Dec 4.

PMID:
18233854
13.

Complex surface dynamics during anodic dissolution of Ni.

Muñoz AG, Vela ME, Salvarezza RC.

Langmuir. 2005 Sep 27;21(20):9238-45.

PMID:
16171357
14.

Morphology and dynamic scaling analysis of cell colonies with linear growth fronts.

Huergo MA, Pasquale MA, Bolzán AE, Arvia AJ, González PH.

Phys Rev E Stat Nonlin Soft Matter Phys. 2010 Sep;82(3 Pt 1):031903. Epub 2010 Sep 14.

PMID:
21230104
15.

Dynamic scaling in thin-film growth with irreversible step-edge attachment.

Aarão Reis FD.

Phys Rev E Stat Nonlin Soft Matter Phys. 2010 Apr;81(4 Pt 1):041605. Epub 2010 Apr 28.

PMID:
20481733
16.

Dynamic scaling study of vapor deposition polymerization: a Monte Carlo approach.

Tangirala S, Landau DP, Zhao YP.

Phys Rev E Stat Nonlin Soft Matter Phys. 2010 Jan;81(1 Pt 1):011605. Epub 2010 Jan 19.

PMID:
20365382
17.

Anomalous roughness with system-size-dependent local roughness exponent.

Balankin AS, Matamoros DM.

Phys Rev E Stat Nonlin Soft Matter Phys. 2005 May;71(5 Pt 2):056102. Epub 2005 May 4.

PMID:
16089597
18.

Dynamic behavior of the interface of striplike structures in driven lattice gases.

Saracco GP, Albano EV.

Phys Rev E Stat Nonlin Soft Matter Phys. 2008 Sep;78(3 Pt 1):031132. Epub 2008 Sep 25.

PMID:
18851018
19.

Generalized survival in step fluctuations.

Tao CG, Cullen WG, Williams ED, Dasgupta C.

Phys Rev E Stat Nonlin Soft Matter Phys. 2007 Aug;76(2 Pt 1):021601. Epub 2007 Aug 14.

PMID:
17930045
20.

Anomalous scaling of the surface width during Cu electrodeposition.

Huo S, Schwarzacher W.

Phys Rev Lett. 2001 Jan 8;86(2):256-9.

PMID:
11177805
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