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Results: 1 to 20 of 125

Similar articles for PubMed (Select 20197803)

1.

Emissivity of microstructured silicon.

Maloney PG, Smith P, King V, Billman C, Winkler M, Mazur E.

Appl Opt. 2010 Mar 1;49(7):1065-8. doi: 10.1364/AO.49.001065.

PMID:
20197803
2.

Ultrahigh infrared normal spectral emissivity of microstructured silicon coating Au film.

Feng G, Li Y, Wang Y, Li P, Zhu J, Zhao L.

Opt Lett. 2012 Feb 1;37(3):299-301. doi: 10.1364/OL.37.000299.

PMID:
22297332
3.

Systematic errors in the measurement of emissivity caused by directional effects.

Kribus A, Vishnevetsky I, Rotenberg E, Yakir D.

Appl Opt. 2003 Apr 1;42(10):1839-46.

PMID:
12683764
5.

Soil emissivity and reflectance spectra measurements.

Sobrino JA, Mattar C, Pardo P, Jiménez-Muñoz JC, Hook SJ, Baldridge A, Ibañez R.

Appl Opt. 2009 Jul 1;48(19):3664-70.

PMID:
19571921
6.
7.

Modeling angular-dependent spectral emissivity of snow and ice in the thermal infrared atmospheric window.

Hori M, Aoki T, Tanikawa T, Hachikubo A, Sugiura K, Kuchiki K, Niwano M.

Appl Opt. 2013 Oct 20;52(30):7243-55. doi: 10.1364/AO.52.007243.

PMID:
24216578
8.

Multiple-integrating sphere spectrophotometer for measuring absolute spectral reflectance and transmittance.

Zerlaut GA, Anderson TE.

Appl Opt. 1981 Nov 1;20(21):3797-804. doi: 10.1364/AO.20.003797.

PMID:
20372262
9.

Measurement of surface temperature and emissivity by a multitemperature method for Fourier-transform infrared spectrometers.

Clausen S, Morgenstjerne A, Rathmann O.

Appl Opt. 1996 Oct 1;35(28):5683-91. doi: 10.1364/AO.35.005683.

PMID:
21127576
10.
11.

[The linearity analysis of ultrahigh temperature FTIR spectral emissivity measurement system].

Wang ZW, Dai JM, He XW, Yang CL.

Guang Pu Xue Yu Guang Pu Fen Xi. 2012 Feb;32(2):313-6. Chinese.

PMID:
22512159
12.

[Analyses of spectral emissivity in radiation temperature measurement].

Fu TR, Cheng XF, Zhong MH, Yang ZJ.

Guang Pu Xue Yu Guang Pu Fen Xi. 2008 Jan;28(1):1-5. Chinese.

PMID:
18422106
14.

[Correction method for infrared spectral emissivity measurement system based on integrating sphere reflectometer].

Zhang YF, Dai JM, Zhang Y, Pan WD, Zhang L.

Guang Pu Xue Yu Guang Pu Fen Xi. 2013 Aug;33(8):2267-71. Chinese.

PMID:
24159891
15.
16.

Visible and near-infrared responsivity of femtosecond-laser microstructured silicon photodiodes.

Carey JE, Crouch CH, Shen M, Mazur E.

Opt Lett. 2005 Jul 15;30(14):1773-5.

PMID:
16092341
17.

Hemi-ellipsoidal mirror infrared reflectometer: development and operation.

Wood BE, Pipes JG, Smith AM, Roux JA.

Appl Opt. 1976 Apr 1;15(4):940-50. doi: 10.1364/AO.15.000940.

PMID:
20165100
18.

Perfect blackbody radiation from a graphene nanostructure with application to high-temperature spectral emissivity measurements.

Matsumoto T, Koizumi T, Kawakami Y, Okamoto K, Tomita M.

Opt Express. 2013 Dec 16;21(25):30964-74. doi: 10.1364/OE.21.030964.

PMID:
24514669
19.

Cryogenic far-infrared laser absorptivity measurements of the Herschel Space Observatory telescope mirror coatings.

Fischer J, Klaassen T, Hovenier N, Jakob G, Poglitsch A, Sternberg O.

Appl Opt. 2004 Jul 1;43(19):3765-71.

PMID:
15250543
20.

[Field measurement of Gobi surface emissivity spectrum at Dunhuang calibration site of China].

Zhang Y, Li Y, Rong ZG, Hu XQ, Zhang LJ, Liu JJ.

Guang Pu Xue Yu Guang Pu Fen Xi. 2009 May;29(5):1213-7. Chinese.

PMID:
19650456
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