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Similar articles for PubMed (Select 19687062)

1.

Aberration-corrected scanning transmission electron microscopy: from atomic imaging and analysis to solving energy problems.

Pennycook SJ, Chisholm MF, Lupini AR, Varela M, Borisevich AY, Oxley MP, Luo WD, van Benthem K, Oh SH, Sales DL, Molina SI, García-Barriocanal J, Leon C, Santamaría J, Rashkeev SN, Pantelides ST.

Philos Trans A Math Phys Eng Sci. 2009 Sep 28;367(1903):3709-33. doi: 10.1098/rsta.2009.0112.

PMID:
19687062
2.

Depth sectioning with the aberration-corrected scanning transmission electron microscope.

Borisevich AY, Lupini AR, Pennycook SJ.

Proc Natl Acad Sci U S A. 2006 Feb 28;103(9):3044-8. Epub 2006 Feb 21. Erratum in: Proc Natl Acad Sci U S A. 2006 Dec 12;103(50):19212.

3.

The three-dimensional point spread function of aberration-corrected scanning transmission electron microscopy.

Lupini AR, de Jonge N.

Microsc Microanal. 2011 Oct;17(5):817-26. doi: 10.1017/S1431927611011913. Epub 2011 Aug 31.

4.

Atomic-resolution STEM in the aberration-corrected JEOL JEM2200FS.

Klie RF, Johnson C, Zhu Y.

Microsc Microanal. 2008 Feb;14(1):104-12. doi: 10.1017/S1431927608080136. Epub 2008 Jan 3.

PMID:
18171499
5.

Aberration-corrected STEM for atomic-resolution imaging and analysis.

Krivanek OL, Lovejoy TC, Dellby N.

J Microsc. 2015 Sep;259(3):165-72. doi: 10.1111/jmi.12254. Epub 2015 May 4.

PMID:
25939916
6.

Aberration-corrected ADF-STEM depth sectioning and prospects for reliable 3D imaging in S/TEM.

Xin HL, Muller DA.

J Electron Microsc (Tokyo). 2009 Jun;58(3):157-65. doi: 10.1093/jmicro/dfn029. Epub 2009 Jan 22.

PMID:
19164489
7.

Depth sectioning in scanning transmission electron microscopy based on core-loss spectroscopy.

D'Alfonso AJ, Findlay SD, Oxley MP, Pennycook SJ, van Benthem K, Allen LJ.

Ultramicroscopy. 2007 Dec;108(1):17-28. Epub 2007 Mar 2.

PMID:
17395376
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9.
10.

Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope.

Nellist PD, Cosgriff EC, Behan G, Kirkland AI.

Microsc Microanal. 2008 Feb;14(1):82-8. Epub 2007 Dec 21.

PMID:
18096098
11.

Imaging single atoms using secondary electrons with an aberration-corrected electron microscope.

Zhu Y, Inada H, Nakamura K, Wall J.

Nat Mater. 2009 Oct;8(10):808-12. doi: 10.1038/nmat2532. Epub 2009 Sep 20.

PMID:
19767737
12.

Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part II: inelastic scattering.

D'Alfonso AJ, Cosgriff EC, Findlay SD, Behan G, Kirkland AI, Nellist PD, Allen LJ.

Ultramicroscopy. 2008 Nov;108(12):1567-78. doi: 10.1016/j.ultramic.2008.05.007. Epub 2008 Jun 1.

PMID:
18617330
13.

Z-contrast Imaging in an Aberration-corrected Scanning Transmission Electron Microscope.

Pennycook SJ, Rafferty B, Nellist PD.

Microsc Microanal. 2000 Jul;6(4):343-352.

PMID:
10898818
14.

Atomic imaging in aberration-corrected high-resolution transmission electron microscopy.

Chen JH, Zandbergen HW, Dyck DV.

Ultramicroscopy. 2004 Jan;98(2-4):81-97.

PMID:
15046789
15.

Behavior of Au species in Au/Fe2O3 catalysts characterized by novel in situ heating techniques and aberration-corrected STEM imaging.

Allard LF, Flytzani-Stephanopoulos M, Overbury SH.

Microsc Microanal. 2010 Aug;16(4):375-85. doi: 10.1017/S1431927610013486. Epub 2010 Jun 22.

PMID:
20569530
16.

Atomic-resolution electron energy loss spectroscopy imaging in aberration corrected scanning transmission electron microscopy.

Allen LJ, Findlay SD, Lupini AR, Oxley MP, Pennycook SJ.

Phys Rev Lett. 2003 Sep 5;91(10):105503. Epub 2003 Sep 5.

PMID:
14525490
17.

Extended depth of field for high-resolution scanning transmission electron microscopy.

Hovden R, Xin HL, Muller DA.

Microsc Microanal. 2011 Feb;17(1):75-80. doi: 10.1017/S1431927610094171. Epub 2010 Dec 2.

PMID:
21122192
18.

Improvement of depth resolution of ADF-SCEM by deconvolution: effects of electron energy loss and chromatic aberration on depth resolution.

Zhang X, Takeguchi M, Hashimoto A, Mitsuishi K, Tezuka M, Shimojo M.

Microsc Microanal. 2012 Jun;18(3):603-11. doi: 10.1017/S1431927612000062. Epub 2012 Apr 12.

PMID:
22494464
19.

Atomic imaging using secondary electrons in a scanning transmission electron microscope: experimental observations and possible mechanisms.

Inada H, Su D, Egerton RF, Konno M, Wu L, Ciston J, Wall J, Zhu Y.

Ultramicroscopy. 2011 Jun;111(7):865-76. doi: 10.1016/j.ultramic.2010.10.002. Epub 2010 Nov 11.

PMID:
21185651
20.

Contrast in atomically resolved EF-SCEM imaging.

Wang P, D'Alfonso AJ, Hashimoto A, Morgan AJ, Takeguchi M, Mitsuishi K, Shimojo M, Kirkland AI, Allen LJ, Nellist PD.

Ultramicroscopy. 2013 Nov;134:185-92. doi: 10.1016/j.ultramic.2013.06.007. Epub 2013 Jul 5.

PMID:
23896032
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