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Items: 1 to 20 of 194

1.

Direct determination of local lattice polarity in crystals.

Mkhoyan KA, Batson PE, Cha J, Schaff WJ, Silcox J.

Science. 2006 Jun 2;312(5778):1354.

2.

Direct sub-angstrom imaging of a crystal lattice.

Nellist PD, Chisholm MF, Dellby N, Krivanek OL, Murfitt MF, Szilagyi ZS, Lupini AR, Borisevich A, Sides WH Jr, Pennycook SJ.

Science. 2004 Sep 17;305(5691):1741.

3.

Seeing atoms with aberration-corrected sub-Angström electron microscopy.

O'Keefe MA.

Ultramicroscopy. 2008 Feb;108(3):196-209. Epub 2007 Oct 18.

PMID:
18054170
4.

Sub-angstrom atomic-resolution imaging from heavy atoms to light atoms.

O'Keefe MA, Shao-Horn Y.

Microsc Microanal. 2004 Feb;10(1):86-95.

PMID:
15306070
5.

Cs-corrected HAADF-STEM imaging of silicate minerals.

Kogure T, Okunishi E.

J Electron Microsc (Tokyo). 2010;59(4):263-71. doi: 10.1093/jmicro/dfq003. Epub 2010 Feb 17.

PMID:
20167574
6.

Direct imaging of hydrogen-atom columns in a crystal by annular bright-field electron microscopy.

Ishikawa R, Okunishi E, Sawada H, Kondo Y, Hosokawa F, Abe E.

Nat Mater. 2011 Apr;10(4):278-81. doi: 10.1038/nmat2957. Epub 2011 Feb 13.

PMID:
21317899
7.
8.
9.

Thin dielectric film thickness determination by advanced transmission electron microscopy.

Diebold AC, Foran B, Kisielowski C, Muller DA, Pennycook SJ, Principe E, Stemmer S.

Microsc Microanal. 2003 Dec;9(6):493-508.

PMID:
14750984
10.

HRTEM imaging of atoms at sub-Angström resolution.

O'Keefe MA, Allard LF, Blom DA.

J Electron Microsc (Tokyo). 2005 Jun;54(3):169-80. Epub 2005 Aug 25.

PMID:
16123071
11.

STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun.

Sawada H, Tanishiro Y, Ohashi N, Tomita T, Hosokawa F, Kaneyama T, Kondo Y, Takayanagi K.

J Electron Microsc (Tokyo). 2009 Dec;58(6):357-61. doi: 10.1093/jmicro/dfp030. Epub 2009 Jun 22.

PMID:
19546144
12.

HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis.

Peng Y, Nellist PD, Pennycook SJ.

J Electron Microsc (Tokyo). 2004;53(3):257-66.

PMID:
15332652
13.

Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy.

Krivanek OL, Chisholm MF, Nicolosi V, Pennycook TJ, Corbin GJ, Dellby N, Murfitt MF, Own CS, Szilagyi ZS, Oxley MP, Pantelides ST, Pennycook SJ.

Nature. 2010 Mar 25;464(7288):571-4. doi: 10.1038/nature08879.

PMID:
20336141
14.

Artifacts in aberration-corrected ADF-STEM imaging.

Yu Z, Batson PE, Silcox J.

Ultramicroscopy. 2003 Sep;96(3-4):275-84.

PMID:
12871794
15.

Effects of electron channeling in HAADF-STEM intensity in La2CuSnO6.

Haruta M, Kurata H, Komatsu H, Shimakawa Y, Isoda S.

Ultramicroscopy. 2009 Mar;109(4):361-7. doi: 10.1016/j.ultramic.2009.01.004. Epub 2009 Jan 14.

PMID:
19201539
16.

Surface channeling in aberration-corrected scanning transmission electron microscopy of nanostructures.

Liu J, Allard LF.

Microsc Microanal. 2010 Aug;16(4):425-33. doi: 10.1017/S1431927610000450. Epub 2010 Jul 2.

PMID:
20598201
17.

Local crystal structure analysis with several picometer precision using scanning transmission electron microscopy.

Kimoto K, Asaka T, Yu X, Nagai T, Matsui Y, Ishizuka K.

Ultramicroscopy. 2010 Jun;110(7):778-82. doi: 10.1016/j.ultramic.2009.11.014. Epub 2009 Nov 26.

PMID:
20199847
18.

Performance and image analysis of the aberration-corrected Hitachi HD-2700C STEM.

Inada H, Wu L, Wall J, Su D, Zhu Y.

J Electron Microsc (Tokyo). 2009 Jun;58(3):111-22. doi: 10.1093/jmicro/dfp011. Epub 2009 Mar 1.

PMID:
19254916
19.

Imaging columns of the light elements carbon, nitrogen and oxygen with sub Angstrom resolution.

Kisielowski C, Hetherington CJ, Wang YC, Kilaas R, O'Keefe MA, Thust A.

Ultramicroscopy. 2001 Nov;89(4):243-63.

PMID:
11766981
20.

Electron diffractive imaging of oxygen atoms in nanocrystals at sub-ångström resolution.

De Caro L, Carlino E, Caputo G, Cozzoli PD, Giannini C.

Nat Nanotechnol. 2010 May;5(5):360-5. doi: 10.1038/nnano.2010.55. Epub 2010 Apr 4.

PMID:
20364132
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