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Items: 1 to 20 of 130

1.

Theoretical analysis of the atomic force microscopy characterization of columnar thin films.

Klapetek P, Ohlídal I.

Ultramicroscopy. 2003 Jan;94(1):19-29.

PMID:
12489592
2.

Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces.

Klapetek P, Ohlídal I, Bílek J.

Ultramicroscopy. 2004 Dec;102(1):51-9.

PMID:
15556700
3.

Determination of effective tip geometries in Kelvin probe force microscopy on thin insulating films on metals.

Glatzel T, Zimmerli L, Koch S, Such B, Kawai S, Meyer E.

Nanotechnology. 2009 Jul 1;20(26):264016. doi: 10.1088/0957-4484/20/26/264016. Epub 2009 Jun 10.

PMID:
19509456
4.

Atomic force microscopy imaging of polycrystalline CuInSe2 thin films

Alberts V V, Hillie KT, Demanet CM.

J Microsc. 2000 Feb;197 (Pt 2):206-15.

5.

Topography and work function measurements of thin MgO(001) films on Ag(001) by nc-AFM and KPFM.

Bieletzki M, Hynninen T, Soini TM, Pivetta M, Henry CR, Foster AS, Esch F, Barth C, Heiz U.

Phys Chem Chem Phys. 2010 Apr 7;12(13):3203-9. doi: 10.1039/b923296f. Epub 2010 Feb 11.

PMID:
20237710
6.

Unexpected square symmetry seen by atomic force microscopy in bilayer films of disk-like molecules.

Maliszewskyj NC, Heiney PA, Josefowicz JY, McCauley JP Jr, Smith AB 3rd.

Science. 1994 Apr 1;264(5155):77-9.

PMID:
17778138
8.

Characterizing atomic force microscopy tip shape in use.

Wang C, Itoh H, Sun J, Hu J, Shen D, Ichimura S.

J Nanosci Nanotechnol. 2009 Feb;9(2):803-8.

PMID:
19441396
9.

Effect of water on the surface molecular mobility of poly(lactide) thin films: an atomic force microscopy study.

Kikkawa Y, Fujita M, Abe H, Doi Y.

Biomacromolecules. 2004 Jul-Aug;5(4):1187-93.

PMID:
15244429
10.

Measuring the sizes of nanospheres on a rough surface by using atomic force microscopy and a curvature-reconstruction method.

Oikawa K, Kim H, Watanabe N, Shigeno M, Shirakawabe Y, Yasuda K.

Ultramicroscopy. 2007 Oct;107(10-11):1061-7. Epub 2007 May 5.

PMID:
17561348
11.

Influence of cross-correlation effects on the optical quantities of rough films.

Franta D, Ohlídal I, Necas D.

Opt Express. 2008 May 26;16(11):7789-803.

PMID:
18545489
12.

Long-range electrostatic forces on the surfaces of aluminum oxide and silica oxide.

Novikov S, Timoshcnkov S.

Adv Colloid Interface Sci. 2003 Sep 18;105:341-53.

PMID:
12969648
13.

Atomic force microscopy characterization of the chemical contrast of nanoscale patterns fabricated by electron beam lithography on polyethylene glycol oxide thin films.

Sirghi L, Bretagnol F, Mornet S, Sasaki T, Gilliland D, Colpo P, Rossi F.

Ultramicroscopy. 2009 Feb;109(3):222-9. doi: 10.1016/j.ultramic.2008.10.022. Epub 2008 Nov 14.

PMID:
19121899
14.

Polysaccharide-protein surface modification of titanium via a layer-by-layer technique: characterization and cell behaviour aspects.

Cai K, Rechtenbach A, Hao J, Bossert J, Jandt KD.

Biomaterials. 2005 Oct;26(30):5960-71.

PMID:
15913761
15.

Thin film and interface properties during ZnO deposition onto high-barrier hybrid/PET flexible substrates.

Koidis C, Logothetidis S, Laskarakis A, Tsiaoussis I, Frangis N.

Micron. 2009 Jan;40(1):130-4. doi: 10.1016/j.micron.2008.02.005. Epub 2008 Feb 16.

PMID:
18406620
16.

Characterisation of nickel silicide thin films by spectroscopy and microscopy techniques.

Bhaskaran M, Sriram S, Holland AS, Evans PJ.

Micron. 2009 Jan;40(1):99-103. doi: 10.1016/j.micron.2007.12.008. Epub 2008 Jan 6.

PMID:
18276146
17.

Nanoplough-constrictions on thin YBCO films made with atomic force microscopy.

Elkaseh AA, Büttner U, Meincken M, Hardie GL, Srinivasu VV, Perold WJ.

J Nanosci Nanotechnol. 2007 Sep;7(9):3348-9.

PMID:
18019174
18.
19.

Probing the viscoelastic response of glassy polymer films using atomic force microscopy.

Yang G, Rao N, Yin Z, Zhu DM.

J Colloid Interface Sci. 2006 May 1;297(1):104-11. Epub 2005 Nov 21.

PMID:
16300781
20.

Explanation and correction of false step heights in amplitude modulation atomic force microscopy measurements on alkane films.

Bai M, Trogisch S, Magonov S, Taub H.

Ultramicroscopy. 2008 Aug;108(9):946-52. doi: 10.1016/j.ultramic.2008.03.009. Epub 2008 Apr 11.

PMID:
18515008
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