Application of semiconductor strain gauge for continuous measurement of intracranial pressure
Nagoya J Med Sci
.
1971 Feb;33(3):231-9.
Authors
H Nagai
,
A Ikeyama
,
S Maeda
,
T Chiku
,
I Igarashi
PMID:
5552731
No abstract available
MeSH terms
Electricity*
Humans
Intracranial Pressure*
Methods
Semiconductors
Temperature