Polyethylenimine-ethoxylated dual interfacial layers for highly efficient and all-solution-processed inverted quantum dot light-emitting diodes

Opt Express. 2020 Nov 9;28(23):33971-33981. doi: 10.1364/OE.406248.

Abstract

Inverted quantum dot light-emitting diodes (QLEDs) were fabricated through all-solution processing by sandwiching quantum dot (QD) emitting layers (EMLs) between dual polyethylenimine-ethoxylated (PEIE) layers. First, a PEIE layer as EML protecting layer (EPL) was formed on a QD EML to protect the EML from the hole transport layer (HTL) solvents and to facilitate the formation of a well-organized structure in the all-solution-processed inverted QLEDs. Second, another PEIE layer was introduced as an electron-blocking layer (EBL) on the zinc oxide (ZnO) electron transport layer (ETL) and effectively suppressed the excessive electron injection to the QD EML, thereby enhancing device efficiency.