Heavy atom labeling enables silanol defect visualization in silicalite-1 crystals

Chem Commun (Camb). 2019 Jan 3;55(4):482-485. doi: 10.1039/c8cc07912a.

Abstract

Using heavy-atom labeling in conjunction with electron microscopy, we here visualize the distribution of point defects, i.e. internal silanol groups, in silicalite-1 zeolites at the single crystal level.