Automatic fringe enhancement with novel bidimensional sinusoids-assisted empirical mode decomposition

Opt Express. 2017 Oct 2;25(20):24299-24311. doi: 10.1364/OE.25.024299.

Abstract

Fringe-based optical measurement techniques require reliable fringe analysis methods, where empirical mode decomposition (EMD) is an outstanding one due to its ability of analyzing complex signals and the merit of being data-driven. However, two challenging issues hinder the application of EMD in practical measurement. One is the tricky mode mixing problem (MMP), making the decomposed intrinsic mode functions (IMFs) have equivocal physical meaning; the other is the automatic and accurate extraction of the sinusoidal fringe from the IMFs when unpredictable and unavoidable background and noise exist in real measurements. Accordingly, in this paper, a novel bidimensional sinusoids-assisted EMD (BSEMD) is proposed to decompose a fringe pattern into mono-component bidimensional IMFs (BIMFs), with the MMP solved; properties of the resulted BIMFs are then analyzed to recognize and enhance the useful fringe component. The decomposition and the fringe recognition are integrated and the latter provides a feedback to the former, helping to automatically stop the decomposition to make the algorithm simpler and more reliable. A series of experiments show that the proposed method is accurate, efficient and robust to various fringe patterns even with poor quality, rendering it a potential tool for practical use.