Herein, we report a straight forward stress probing method based on mechanically tunable organic VCSELs via dual detecting-modes. By designing the active layer thickness, uploaded stress was measured simultaneously by the laser wavelength and mode separations, facilitating highly sensitive stress detection in broad ranges. Single-mode laser emission with low threshold and narrow line-width was characterized, which could be tuned continuously within 8 nm. The probing sensitivity and resolution were estimated to be 60 Pa and 5.6 nm/KPa respectively, which were ~160-folds higher than previous results.