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Phys Rev Lett. 2013 Dec 27;111(26):266102. Epub 2013 Dec 26.

Ion depletion near a solution surface: is image-charge repulsion sufficient?

Author information

  • 1Institute for Atmospheric and Climate Science, ETH Zurich, 8092 Zurich, Switzerland.
  • 2Laboratory for Surface Science and Technology, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland and Dipartimento di Scienze Chimiche e Geologiche, Università€ degli Studi di Cagliari, 09042 Monserrato (Cagliari), Italy.
  • 3Laboratory for Surface Science and Technology, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland.
  • 4Physics Department, University at Albany, Albany, New York 12222, USA.

Abstract

Grazing-incidence Rutherford backscattering and angle-resolved x-ray photoelectron spectrometry are used to determine the ion-concentration profiles near the surface of a solution consisting of a salt (TEABr) in a weakly polar organic liquid (polyethylene glycol) with atomic-layer depth resolution. The predictions of a model, in which ions in solution are repelled from the surface due to a screened Coulomb interaction with their image charge, are in good agreement with measured ion profiles. This contrasts with the behavior of salts in aqueous and highly polar organic solutions.

PMID:
24483806
[PubMed]
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