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J Am Chem Soc. 2013 May 8;135(18):6758-61. doi: 10.1021/ja400637n. Epub 2013 Apr 30.

Atomic resolution imaging of grain boundary defects in monolayer chemical vapor deposition-grown hexagonal boron nitride.

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  • 1Department of Chemistry, University of California, Berkeley, California 94720, United States.


Grain boundaries are observed and characterized in chemical vapor deposition-grown sheets of hexagonal boron nitride (h-BN) via ultra-high-resolution transmission electron microscopy at elevated temperature. Five- and seven-fold defects are readily observed along the grain boundary. Dynamics of strained regions and grain boundary defects are resolved. The defect structures and the resulting out-of-plane warping are consistent with recent theoretical model predictions for grain boundaries in h-BN.

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