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Nano Lett. 2012 Dec 12;12(12):6260-5. doi: 10.1021/nl303353r. Epub 2012 Nov 15.

Thermally induced parametric instability in a back-action evading measurement of a micromechanical quadrature near the zero-point level.

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  • 1Applied Physics, California Institute of Technology, Pasadena, California 91125, United States.

Erratum in

  • Nano Lett. 2013 Jun 12;13(6):3002.


We report the results of back-action evading experiments utilizing a tightly coupled electro-mechanical system formed by a radio frequency micromechanical resonator parametrically coupled to a NbTiN superconducting microwave resonator. Due to excess dissipation in the microwave resonator, we observe a parametric instability induced by a thermal shift of the mechanical resonance frequency. In light of these measurements, we discuss the constraints on microwave dissipation needed to perform BAE measurements far below the zero-point level.

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