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Opt Lett. 2012 Jun 15;37(12):2340-2. doi: 10.1364/OL.37.002340.

Shrinkage of picosecond laser beam by plasma reflection in super-resolution near-field structure of SiN/Sb/SiN thin film.

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  • 1Department of Physics, National Chung Cheng University, Minhsiung, Chiayi 62102, Taiwan.


The transmittive and reflective Z-scan technique is used with a 10 Hz, frequency doubled, Q-switched, and mode-locked Nd:YAG laser to verify that the reflectivity of the super-resolution near-field structure of an SiN/Sb/SiN thin film increases as incident intensity decreases. This intensity-dependent reflection, called nonlinear reflection, reflects a TEM(00) mode laser beam more strongly at its periphery than at its center and so shrinks the transmitted laser beam. The observed nonlinear reflection is attributed to laser-induced change of carrier densities in Sb, to justify quantitatively the experimental results.

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