Send to:

Choose Destination
See comment in PubMed Commons below
J Nanosci Nanotechnol. 2012 Feb;12(2):1466-70.

Effects of Pt junction on electrical transport of individual ZnO nanorod device fabricated by focused ion beam.

Author information

  • 1Nano Analysis Center KIST, Hawolkok-dong, Sungbuk-ku, Seoul 130-650, Korea.


The electrical transport of individual ZnO nanorod devices manufactured by focused ion beam (FIB) was investigated by the direct measurement of electrical resistance at electrode junctions of cross-sectioned devices using two nanoprobes. The cathodoluminescence (CL) measurements were also performed to evaluate the crystallinity at the center and edge of the cross-sectioned ZnO nanorods. The electrical transport of the individual ZnO nanorod device depends strongly on the crystallinity of the ZnO nanorod itself and the carbon contents at Pt junctions. The ZnO-Au junction of the device acted as the fastest path for electrical transport.

PubMed Commons home

PubMed Commons

How to join PubMed Commons

    Supplemental Content

    Loading ...
    Write to the Help Desk