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Micron. 2012 Nov;43(11):1140-6. doi: 10.1016/j.micron.2012.01.009. Epub 2012 Feb 2.

Simultaneous measurement of static and kinetic friction of ZnO nanowires in situ with a scanning electron microscope.

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  • 1Institute of Physics, University of Tartu, Riia st. 142, 51014 Tartu, Estonia. boriss.polakovs@ut.ee

Abstract

A novel method for in situ measurement of the static and kinetic friction is developed and demonstrated for zinc oxide nanowires (NWs) on oxidised silicon wafers. The experiments are performed inside a scanning electron microscope (SEM) equipped with a nanomanipulator with an atomic force microscope tip as a probe. NWs are pushed by the tip from one end until complete displacement is achieved, while NW bending is monitored by the SEM. The elastic bending profile of a NW during the manipulation process is used to calculate the static and kinetic friction forces.

Copyright © 2012 Elsevier Ltd. All rights reserved.

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