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Opt Lett. 2011 Aug 1;36(15):2892-4. doi: 10.1364/OL.36.002892.

Fast localized wavefront correction using area-mapped phase-shift interferometry.

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  • 1Department of Biomedical Engineering & Laboratory for Optical and Computational Instrumentation, University of Wisconsin - Madison, 1675 Observatory Drive, Madison, Wisconsin 53706, USA.


We propose an innovative method for localized wavefront correction based on area-mapped phase-shift (AMPS) interferometry. In this Letter, we present the theory and then experimentally compare it with a previously demonstrated method based on spot-optimized phase-stepping (SOPS) interferometry. We found that AMPS outperforms SOPS interferometry in terms of speed by threefold, although in noisy environments the improvements may be larger. AMPS yielded similar point-spread functions (PSF) as SOPS for moderate system-induced aberrations, but yielded a slightly less ideal PSF for larger aberrations. The method described in this Letter may prove crucial for applications where the phase-stepping solution does not have sufficient speed.

© 2011 Optical Society of America

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