Assessment of waveguiding properties of gallium oxide nanostructures by angle resolved cathodoluminescence in a scanning electron microscope

Emilio Nogales; Bianchi Méndez; Javier Piqueras

doi:10.1016/j.ultramic.2011.03.003

Assessment of waveguiding properties of gallium oxide nanostructures by angle resolved cathodoluminescence in a scanning electron microscope

Ultramicroscopy. 2011 Jul;111(8):1037-42. doi: 10.1016/j.ultramic.2011.03.003. Epub 2011 Mar 21.

Authors

Emilio Nogales¹, Bianchi Méndez, Javier Piqueras

Affiliation

¹ Departamento Física de Materiales, Universidad Complutense de Madrid 28040, Spain. emilio.nogales@fis.ucm.es

PMID: 21740866
DOI: 10.1016/j.ultramic.2011.03.003

Abstract

Cathodoluminescence (CL) of Ga(2)O(3) nanowires and planar microstructures has been studied in a scanning electron microscope, as a function of the orientation angle of the structures relative to the position of the light detection system in the microscope chamber. CL contrast shows a marked dependence on the detection angle due to the waveguiding behaviour of the structures. The angle resolved cathodoluminescence (ARCL) measurements enable to evaluate the optical losses of guided blue-ultraviolet light in nanowires with diameters in the sub-wavelength range, deposited on graphite tape or silicon. In planar, branched feather-like microstructures, ARCL images demonstrate the directional-dependent light guiding behaviour of the nano-branches.