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Appl Opt. 2010 Jul 10;49(20):3922-5. doi: 10.1364/AO.49.003922.

Comparison of Mg-based multilayers for solar He II radiation at 30.4 nm wavelength.

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  • 1Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai 200092, China.


Mg-based multilayers, including SiC/Mg, Co/Mg, B(4)C/Mg, and Si/Mg, are investigated for solar imaging and a He II calibration lamp at a 30.4 nm wavelength. These multilayers were fabricated by a magnetron sputtering method and characterized by x-ray reflection. The reflectivities of these multilayers were measured by synchrotron radiation. Near-normal-incidence reflectivities of Co/Mg and SiC/Mg multilayer mirrors are as high as 40.3% and 44.6%, respectively, while those of B(4)C/Mg and Si/Mg mirrors are too low for application. The measured results suggest that SiC/Mg, Co/Mg multilayers are promising for a 30.4 nm wavelength.

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