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J Microsc. 2010 Mar;237(3):337-40. doi: 10.1111/j.1365-2818.2009.03256.x.

TEM characterization of MBE grown CdTe/ZnTe axial nanowires.

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  • 1Institute of Physics, PAS, Al. Lotników 32/46, 02-668, Warsaw, Poland. dluzew@ifpan.edu.pl

Abstract

CdTe/ZnTe axial nanowires were successfully fabricated by molecular beam epitaxy with the use of Au nano-catalysts and vapour-liquid-solid growth mechanism. Nanowires had zinc-blende structure with numerous stacking faults in the bottom ZnTe part and near perfect crystalline structure in the top CdTe part. Energy dispersive X-ray spectroscopy (EDXS) and lattice fringe spacing analysis revealed nonabrupt nature of hetero-interface, whose width was estimated to be 50-70 nm for the nanowires having a diameter in the range from 40 to 50 nm.

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