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Opt Express. 2010 Mar 29;18(7):6957-71. doi: 10.1364/OE.18.006957.

Properties of broadband depth-graded multilayer mirrors for EUV optical systems.

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  • 1FOM-Institute for Plasma Physics Rijnhuizen, NL-3430 BE Nieuwegein, The Netherlands.


The optical properties of a-periodic, depth-graded multilayer mirrors operating at 13.5 nm wavelength are investigated using different compositions and designs to provide a constant reflectivity over an essentially wider angular range than periodic multilayers. A reflectivity of up to about 60% is achieved in these calculation in the [0, 18 degrees] range of the angle of incidence for the structures without roughness. The effects of different physical and technological factors (interfacial roughness, natural interlayers, number of bi-layers, minimum layer thickness, inaccuracy of optical constants, and thickness errors) are discussed. The results from an experiment on the fabrication of a depth-graded Mo/Si multilayer mirror with a wide angular bandpass in the [0, 16 degrees] range are presented and analyzed.

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