Ellipsometry data analysis aided by derivative plots in n,K-space
Appl Opt
.
1980 Jun 1;19(11):1735-6.
doi: 10.1364/AO.19.001735.
Authors
A J Melmed
,
J J Carroll
PMID:
20221111
DOI:
10.1364/AO.19.001735
No abstract available