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Appl Opt. 1979 May 1;18(9):1428-35. doi: 10.1364/AO.18.001428.

Nearly perfect multilayer dielectric reflectors: theory.


Reflectance, absorptance, and phase distortion of highly reflecting dielectric mirrors subject to small deviations from normal incidence, optimum wavelength lambda, and layer thickness d and index n are derived by matrix methods carried to first order in the absorption and second order in other parameters. Only small errors in absorptance or reflectance are made by oblique incidence measurements or by changes in lambda, n, or d, typical errors in A[~0(2), (Deltalambda)(2), (Deltan)(2), (Deltad)(2)] being 1% for 0 = 5.8 degrees or 4.5% for a 59% change in lambda, n, or d. Phase distortions ΓΈ(r) also are small, typically 0.01 rad for either 0 approximately 7 degrees or a 0.3% change in lambda, n, or d.

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