Characterization of optical thin films

Appl Opt. 1979 Jun 15;18(12):1969-77. doi: 10.1364/AO.18.001969.

Abstract

Various properties of dielectric thin films are discussed in this paper: refractive index and absorption coefficient, light scattering, structure, microstructure, density, gas sorption, chemical composition, homogeneity, adhesion, hardness and mechanical stress, and environmental influences.